Petrik, Péter and Agócs, Emil and Kalas, B. and Kozma, Péter and Fodor, Bálint and Nádor, Judit and Major, Csaba and Fried, Miklós (2015) Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9529. pp. 1-5. ISSN 0277-786X
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Official URL: https://dx.doi.org/10.1117/12.2184850
| Item Type: | Article |
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| Subjects: | Q Science / természettudomány > QC Physics / fizika Q Science / természettudomány > QC Physics / fizika > QC02 Optics / fénytan |
| SWORD Depositor: | MTMT SWORD |
| Depositing User: | MTMT SWORD |
| Date Deposited: | 08 Oct 2015 07:34 |
| Last Modified: | 13 Oct 2015 07:15 |
| URI: | http://real.mtak.hu/id/eprint/29651 |
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