Nanocrystalline materials studied by powder diffraction line profile analysis

Ungár, Tamás and Gubicza, Jenő (2007) Nanocrystalline materials studied by powder diffraction line profile analysis. Zeitschrift für Kristallographie, 222 (3-4). pp. 114-128. ISSN 0044-2968

Preview

Text 1115941.pdf Download (545kB) | Preview

Abstract

X-ray powder diffraction is a powerful tool for characterising the microstructure of crystalline materials in terms of size and strain. It is widely applied for nanocrystalline materials, especially since other methods, in particular electron microscopy is, on the one hand tedious and time consuming, on the other hand, due to the often metastable states of nanomaterials it might change their microstructures. It is attempted to overview the applications of microstructure characterization by powder diffraction on nanocrystalline metals, alloys, ceramics and carbon base materials. Whenever opportunity is given, the data provided by the X-ray method are compared and discussed together with results of electron microscopy. Since the topic is vast we do not try to cover the entire field.

Actions (login required)

Edit Item