Bóta, Attila (2013) Development of powder diffraction apparatus for small-angle X-ray scattering measurements. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 46 (2). pp. 573-576. ISSN 0021-8898
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Abstract
A novel type of X-ray collimation system attached to commercial powder diffractometers makes the structural characterization of nanomaterials possible in a wide size range from <0.1 to 100 nm by combination of the small- and wide-angle X-ray scattering techniques. There is no dead interval in the detection between the small- and wide-angle regimes. This device can be attached to any existing 'θ/θ' powder diffractometer, providing a multi-functional small- and wide-angle X-ray scattering/diffraction (SWAXS) apparatus. After proper alignment and adjustment, the device can be removed and re-attached at any time to switch between normal and SWAXS functions. Copyright © International Union of Crystallography 2013.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | X rays; Diffractometers; DIFFRACTION; X-ray collimation; STRUCTURAL CHARACTERIZATION; Small- and wide-angle X-ray scatterings; Small angle X-ray scattering; Powder diffractometers; Commercial powders; X-ray collimation systems; Small- and wide-angle X-ray scattering (SWAXS); Powder Diffraction; instrumentation |
| Subjects: | R Medicine / orvostudomány > RM Therapeutics. Pharmacology / terápia, gyógyszertan |
| SWORD Depositor: | MTMT SWORD |
| Depositing User: | MTMT SWORD |
| Date Deposited: | 25 Sep 2013 10:53 |
| Last Modified: | 25 Sep 2013 10:53 |
| URI: | http://real.mtak.hu/id/eprint/6741 |
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