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Influence of 20 MeV electron irradiation on the optical properties and phase composition of SiOx thin films

Hristova-Vasileva, T. and Petrik, Péter and Nesheva, D. and Fogarassy, Zsolt and Lábár, János (2018) Influence of 20 MeV electron irradiation on the optical properties and phase composition of SiOx thin films. JOURNAL OF APPLIED PHYSICS, 123 (19). pp. 1-9. ISSN 0021-8979

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Item Type: Article
Subjects: Q Science / természettudomány > QC Physics / fizika
SWORD Depositor: MTMT SWORD
Depositing User: MTMT SWORD
Date Deposited: 14 Jun 2018 10:25
Last Modified: 31 May 2019 23:15
URI: http://real.mtak.hu/id/eprint/80481

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