Parameterization of the dielectric function of semiconductor nanocrystals

Petrik, Péter (2014) Parameterization of the dielectric function of semiconductor nanocrystals. PHYSICA B - CONDENSED MATTER, 453. pp. 2-7. ISSN 0921-4526

Preview

Text PhysB_Parameterization_draft.pdf Download (2MB) | Preview

Abstract

Optical methods like spectroscopic ellipsometry are sensitive to structural properties of semiconductor films such as crystallinity or grain size. The imaginary part of the dielectric function is proportional to the joint density of electronic states. Consequently, the analysis of the dielectric function around the critical point energies provides useful information about the electron band structure and all related parameters like the grain structure, band gap, temperature, composition, phase structure, carrier mobility, etc. In this work an attempt is made to present a selection of the approaches to parameterize and analyze the dielectric function of semiconductors, as well as some applications.

Actions (login required)

Edit Item