Pálfi, Vilmos and Kollár, István (2014) Realiable ADC testing using LabVIEW. In: 20th IMEKO TC4 International Symposium and 18th International Workshop on ADC Modelling and Testing Research on Electric and Electronic Measurement for the Economic Upturn, 2014.09.15-2014.09.17, Benevento.
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Abstract
Abstract – The sinewave histogram test is a commonly used method to characterize nonlinear behavior of A/D converters. Accurate test results require wise choice of the test settings and signal parameters. However, standard methods do not support the recognition of bad parameter settings. In addition, those may provide inaccurate results even when the signal settings are optimal for the histogram test. This paper presents a software which helps handling above problems and deficiencies to guarantee the quality of the test results.
| Item Type: | Conference or Workshop Item (Lecture) |
|---|---|
| Subjects: | T Technology / alkalmazott, műszaki tudományok > T2 Technology (General) / műszaki tudományok általában |
| SWORD Depositor: | MTMT SWORD |
| Depositing User: | MTMT SWORD |
| Date Deposited: | 26 Aug 2014 13:19 |
| Last Modified: | 26 Aug 2014 13:19 |
| URI: | http://real.mtak.hu/id/eprint/14329 |
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