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Ellipsometry of semiconductor nanocrystals

Petrik, Péter and Fried, Miklós (2013) Ellipsometry of semiconductor nanocrystals. In: Ellipsometry at the nanoscale. Springer-Verlag, Berlin Heidelberg, pp. 583-606. ISBN 978-3-642-33956-1

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Item Type: Book Section
Subjects: T Technology / alkalmazott, műszaki tudományok > T2 Technology (General) / műszaki tudományok általában
Depositing User: Andrea Bolgár
Date Deposited: 16 Jan 2014 15:11
Last Modified: 16 Jan 2014 15:11
URI: http://real.mtak.hu/id/eprint/8901

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