Items where Author is "Frigeri, C."

Serényi, Miklós and Frigeri, C. and Csik, A. and Nguyen Quoc, Khánh and Németh, Attila and Zolnai, Zsolt (2017) On the mechanisms of hydrogen induced blistering in RF sputtered amorphous Ge. CRYSTENGCOMM. pp. 1-29. ISSN 1466-8033

Frigeri, C. and Serényi, Miklós and Szekrényes, Zsolt and Kamarás, Katalin and Csik, Attila and Nguyen Quoc, Khánh (2015) Effect of heat treatments on the properties of hydrogenated amorphous silicon for PV and PVT applications. SOLAR ENERGY, 119. pp. 225-232. ISSN 0038-092X

Frigeri, C. and Serényi, Miklós and Csik, Attila and Szekrényes, Zsolt and Kamarás, Katalin and Nasi, L. and Khánh, Nguyen Quoc (2013) Evolution of the structure and hydrogen bonding configuration in annealed hydrogenated a-Si/a-Ge multilayers and layers. APPLIED SURFACE SCIENCE, 269. pp. 12-16. ISSN 0169-4332

Frigeri, C. and Serényi, Miklós and Khánh, Nguyen Quoc and Csík, Attila and Nasi, L. and Erdélyi, Z. and Beke, Dezső and Boyen, H -G (2013) Hydrogen behaviour in amorphous Si/Ge nano-structures after annealing. APPLIED SURFACE SCIENCE, 267. pp. 30-34. ISSN 0169-4332

Frigeri, C. and Nasi, L. and Serényi, Miklós and Khánh, Nguyen Quoc and Szekrényes, Zsolt and Kamarás, Katalin and Csik, Attila (2013) From nano voids to blisters in hydrogenated amorphous silicon. In: PROCEEDINGS OF INTERNATIONAL CONFERENCE NANOMEETING-2013: PHYSICS,CHEMISTRYAND APPLICATIONS OF NANOSTRUCTURES. World Scientific, Singapore, pp. 176-179. ISBN 978-981-4460-17-0

Frigeri, C. and Serényi, Miklós and Csik, Attila and Erdélyi, Zoltán and Beke, Dezső (2009) AFM and TEM study of hydrogenated sputtered Si/Ge multilayers. SUPERLATTICES AND MICROSTRUCTURES, 45 (4-5). pp. 475-481. ISSN 0749-6036

Frigeri, C. and Serényi, Miklós and Csík, Attila and Erdélyi, Zoltán and Beke, Dezső and Nasi, L. (2008) Structural modifications induced in hydrogenated amorphous Si/Ge multilayers by heat treatments. Journal of Materials Science: Materials in Electronics, 19 (S1). pp. 289-293. ISSN 0957-4522

Serényi, Miklós and Lohner, Tivadar and Petrik, Péter and Frigeri, C. (2007) Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy. Thin Solid Films, 515 (7-8). pp. 3559-3562. ISSN 0040-6090