Items where Author is "Fried, Miklós"

Lábadi, Zoltán and Takács, Dániel and Zolnai, Zsolt and Petrik, Péter and Fried, Miklós (2024) Compositional Optimization of Sputtered WO3/MoO3 Films for High Coloration Efficiency. MATERIALS, 17 (5). No.-1000. ISSN 1996-1944

Petrik, Péter and Fried, Miklós and Lohner, Tivadar (2024) Optikai módszerek az MFA-ban. FIZIKAI SZEMLE : MAGYAR FIZIKAI FOLYÓIRAT, 74 (3). pp. 80-83. ISSN 0015-3257 (nyomtatott); 1588-0540 (elektronikus)

Ismaeel, Noor T. and Lábadi, Zoltán and Petrik, Péter and Fried, Miklós (2023) Investigation of Electrochromic, Combinatorial TiO2-SnO2 Mixed Layers by Spectroscopic Ellipsometry Using Different Optical Models. MATERIALS, 16 (12). ISSN 1996-1944

Nugusse, Berhane and Juhász, György and Major, Csaba and Petrik, Péter and Kálvin, Sándor and Horváth, Zoltán György and Fried, Miklós (2023) Multi-Color Ellipsometric Mapping Tool from Cheap Parts. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 12428. pp. 134-141. ISSN 0277-786X (print); 1996-756X (online)

Mukherjee, Deshabrato and Kalas, Benjamin and Burger, Sven and Sáfrán, György and Serényi, Miklós and Fried, Miklós and Petrik, Péter (2023) Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry. In: Photonic Instrumentation Engineering X. International Society for Optics and Photonics, pp. 206-214. ISBN 9781510659612; 9781510659629

Bányász, István and Rajta, István and Nagy, Gyula U. L. and Khanh, Nguyen Q. and Havránek, Vladiimir and Fried, Miklós and Szabó, Zoltán and Veres, Miklós and Holomb, Roman and Himics, László and Tichy-Rács, Éva (2022) Characterisation of Channel Waveguides Fabricated in an Er3+-Doped Tellurite Glass Using Two Ion Beam Techniques. CHEMOSENSORS, 10 (8). pp. 1-17. ISSN 2227-9040

Kalas, Benjámin and Defforge, Thomas and Gautier, Gaël and Chaix, Arnaud and Fried, Miklós and Petrik, Péter (2022) Development of Advanced Sensing Materials and Interface Structures for In-Situ Bioellipsometry. In: Label-free Biomedical Imaging and Sensing (SPIE BIOS 2022), 2022. március 2., San Francisco (CA).

Defforge, Thomas and Chaix, Arnaud and Kalas, Benjámin and Fried, Miklós and Petrik, Péter (2022) Development of Silicon Nanoparticles for Plasmonic Sensing. In: Colloidal Nanoparticles for Biomedical Applications XVII (SPIE BIOS 2022), 2022. március 3., San Francisco (CA).

Lohner, Tivadar and Németh, Attila and Zolnai, Zsolt and Kalas, Benjamin and Romanenko, Alekszej and Nguyen Quoc, Khánh and Szilágyi, Edit and Kótai, Endre and Agócs, Emil and Tóth, Zsolt and Budai, Judit and Petrik, Péter and Fried, Miklós and Bársony, István and Gyulai, József (2022) Disorder and cavity evolution in single-crystalline Ge during implantation of Sb ions monitored in-situ by spectroscopic ellipsometry. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 152. No. 107062. ISSN 1369-8001

Fried, Miklós and Boga, Renato and Takacs, Daniel and Lábadi, Zoltán and Horváth, Zsolt Endre and Zolnai, Zsolt (2022) Investigation of Combinatorial WO3-MoO3 Mixed Layers by Spectroscopic Ellipsometry using Different Optical Models. NANOMATERIALS, 12 (14). No.-2421. ISSN 2079-4991

Petrik, Péter and Fried, Miklós (2022) Mapping and imaging of thin films on large surfaces. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. ISSN 1862-6300 (In Press)

Kalas, Benjámin and Sáfrán, György and Serényi, Miklós and Fried, Miklós and Petrik, Péter (2022) Scanning-Resonance Optical Sensing based on a Laterally Graded Plasmonic Layer – Optical Properties of Ag x Al 1 − x in the Range of x = 0 to 1. APPLIED SURFACE SCIENCE : A JOURNAL DEVOTED TO APPLIED PHYSICS AND CHEMISTRY OF SURFACES AND INTERFACES. pp. 1-38. ISSN 0169-4332 (print); 1873-5584 (online) (In Press)

Fried, Miklós (2022) Symposium on Materials Science. Mátraháza, Hungary, October 4-6, 2021. Óbuda University, Mátraháza. ISBN 978-963-449-290-0

Kalas, Benjamin and Ferencz, Kárpát and Saftics, András and Czigány, Zsolt and Fried, Miklós and Petrik, Péter (2021) Bloch surface waves biosensing in the ultraviolet wavelength range – Bragg structure design for investigating protein adsorption by in situ Kretschmann-Raether ellipsometry. APPLIED SURFACE SCIENCE, 536. ISSN 0169-4332

Jankovics, Hajnalka and Szekér, P. and Tóth, Éva and Kakasi, Balázs and Lábadi, Zoltán and Saftics, András and Kalas, Benjamin and Fried, Miklós and Petrik, Péter and Vonderviszt, Ferenc (2021) Flagellin-based electrochemical sensing layer for arsenic detection in water. SCIENTIFIC REPORTS, 11 (1). ISSN 2045-2322

Lohner, Tivadar and Németh, Attila and Zolnai, Zsolt and Kalas, Benjamin and Romanenko, Alekszej and Nguyen Quoc, Khánh and Szilágyi, Edit and Kótai, Endre and Agócs, Emil and Petrik, Péter and Fried, Miklós and Bársony, István and Gyulai, József (2021) In-Situ Control of Defect Dynamics By Ellipsometry During Ion Implantation – Evolution of Disorder and Cavity Structure in Single-Crystalline Ge During Implantation of Sb Ions. SCIENTIFIC REPORTS, 11. ISSN 2045-2322

Lohner, Tivadar and Szilágyi, Edit and Zolnai, Zsolt and Németh, Attila and Fogarassy, Zsolt and Illés, Levente and Kótai, Endre and Petrik, Péter and Fried, Miklós (2020) Determination of the Complex Dielectric Function of Ion-Implanted Amorphous Germanium by Spectroscopic Ellipsometry. COATINGS, 10 (5). pp. 1-10. ISSN 2079-6412

Saftics, András and Türk, Barbara and Sulyok, Attila and Nagy, Norbert and Agócs, Emil and Kalas, Benjamin and Petrik, Péter and Fried, Miklós and Nguyen Quoc, Khánh and Kamarás, Katalin and Székács, Inna and Horváth, Róbert and Kurunczi, Sándor (2020) Dextran-based Hydrogel Layers for Biosensors. In: Nanobiomaterial Engineering. Springer Singapore, Singapore, pp. 139-164. ISBN 9789813298408; 9789813298392

Romanenko, Alekszej and Kalas, Benjamin and Hermann, Petra and Hakkel, Orsolya and Illés, Levente and Fried, Miklós and Fürjes, Péter and Gyulai, Gergő and Petrik, Péter (2020) Membrane-Based In Situ Mid-Infrared Spectroscopic Ellipsometry: A Study on the Membrane Affinity of Polylactide-co-glycolide Nanoparticulate Systems. ANALYTICAL CHEMISTRY, in pre. ISSN 0003-2700

Kalas, Benjamin and Zolnai, Zsolt and Sáfrán, György and Serényi, Miklós and Agócs, Emil and Lohner, Tivadar and Németh, Attila and Nguyen Quoc, Khánh and Fried, Miklós and Petrik, Péter (2020) Micro-combinatorial sampling of the optical properties of hydrogenated amorphous Si_{1-x}Ge_{x} for the entire range of compositions towards a database for optoelectronics. SCIENTIFIC REPORTS. ISSN 2045-2322

Lábadi, Zoltán and Kalas, Benjamin and Saftics, András and Illés, Levente and Jankovics, Hajnalka and Bereczk-Tompa, Éva and Kakasi, Balázs and Vonderviszt, Ferenc and Fried, Miklós and Petrik, Péter (2020) Sensing Layer for Ni Detection in Water Created by Immobilization of Bioengineered Flagellar Nanotubes on Gold Surfaces. ACS BIOMATERIALS-SCIENCE & ENGINEERING, 6 (7). pp. 3811-3820. ISSN 2373-9878

Zolnai, Zsolt and Zámbó, Dániel and Osváth, Zoltán and Nagy, Norbert and Fried, Miklós and Németh, Attila and Pothorszky, Szilárd and Szekrényes, Dániel Péter and Deák, András (2018) Gold Nanorod Plasmon Resonance Damping Effects on a Nanopatterned Substrate. JOURNAL OF PHYSICAL CHEMISTRY C, 122 (43). pp. 24941-24948. ISSN 1932-7447

Kalas, Benjamin and Pollakowski, Beatrix and Nutsch, Andreas and Streeck, Cornelia and Nádor, Judit and Fried, Miklós and Petrik, Péter (2017) Ellipsometric and X-Ray Spectrometric Investigation of Fibrinogen Protein Layers. PHYSICA STATUS SOLIDI C-CURRENT TOPICS IN SOLID STATE PHYSICS, 14 (12). pp. 1-7. ISSN 1862-6351

Kalas, Benjamin and Nádor, Judit and Agócs, Emil and Saftics, András and Kurunczi, S. and Fried, Miklós and Petrik, Péter (2017) Protein adsorption monitored by plasmon-enhanced semi-cylindrical Kretschmann ellipsometry. APPLIED SURFACE SCIENCE, 421. pp. 585-592. ISSN 0169-4332

Bányász, István and Nagy, G.U.L. and Havranek, V. and Vosecek, V. and Agócs, Emil and Fried, Miklós and Rakovics, Vilmos (2017) Recent progress in ion beam fabrication of integrated optical elements. In: 19th International Conference on Transparent Optical Networks, ICTON 2017. International Conference on Transparent Optical Networks . IEEE Computer Society, Washington, p. 8024871. ISBN 9781538608586

Saftics, András and Kurunczi, Sándor and Türk, Barbara and Agócs, Emil and Kalas, Benjamin and Petrik, Péter and Fried, Miklós and Sulyok, Attila and Horváth, Róbert (2017) SPIN COATED CARBOXYMETHY L DEXTRAN LAYERS ON TiO 2 -SiO 2 OPTICAL WAVEGUIDE SURFACES. REVUE ROUMAINE DE CHIMIE, 62 (10). pp. 775-782. ISSN 0035-3930

Bányász, István and Pelli, S. and Nunzi-Conti, G. and Righini, G. C. and Berneschi, S. and Szilágyi, Edit and Fried, Miklós and Lohner, Tivadar and Petrik, Péter and Zolnai, Zsolt and Nguyen Quoc, Khánh and Veres, Miklós and Himics, László (2016) Design and fabrication of integrated optical elements in glasses and crystals by various ion beam techniques. In: 12th International Topical Meeting on Nuclear Applications of Accelerators (AccApp '15). American Nuclear Society, Kensington, pp. 389-415.

Fodor, Bálint and Kozma, Péter and Burger, S. and Fried, Miklós and Petrik, Péter (2016) Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method. Thin Solid Films. pp. 1-5. ISSN 0040-6090

Agócs, Emil and Kozma, Péter and Nádor, Judit and Hámori, András and Janosov, Milán and Kurunczi, Sándor and Fodor, Bálint and Fried, Miklós and Horváth, Róbert and Petrik, Péter (2016) Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions. Applied Surface Science. pp. 1-6. ISSN 0169-4332 (In Press)

Nádor, Judit and Kalas, Benjamin and Saftics, András and Agócs, Emil and Kozma, Péter and Kőrösi, László Tamás and Székács, Inna and Fried, Miklós and Horváth, Róbert (2016) Plasmon-enhanced two-channel in situ Kretschmann ellipsometry of protein adsorption, cellular adhesion and polyelectrolyte deposition on titania nanostructures. OPTICS EXPRESS, 24 (5). pp. 4812-4823. ISSN 1094-4087, ESSN: 1094-4087

Fodor, Bálint and Agócs, Emil and Bardet, Benjamin and Defforge, Thomas and Cayrel, Frederic and Fried, Miklós and Petrik, Péter (2016) Porosity and thickness characterization of porous Si and oxidized porous Si layers – an ultraviolet-visible-mid infrared ellipsometry study. MICROPOROUS and Mesoporous Materials, in pre. in press. ISSN 1387-1811

Lohner, Tivadar and Serényi, Miklós and Szilágyi, Edit and Zolnai, Zsolt and Czigány, Zsolt and Nguyen Quoc, Khánh and Petrik, Péter and Fried, Miklós (2016) Spectroellipsometric detection of silicon substrate damage caused by radiofrequency sputtering of niobium oxide. APPLIED SURFACE SCIENCE. pp. 1-30. ISSN 0169-4332

Fodor, Bálint and Defforge, Thomas and Agócs, Emil and Fried, Miklós and Gautier, Gaël and Petrik, Péter (2016) Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires. APPLIED SURFACE SCIENCE. pp. 1-8. ISSN 0169-4332

Bányász, István and Berneschi, S. and Fried, Miklós and Havranek, V. and Nguyen Quoc, Khánh and Németh, Attila and Szilágyi, Edit and Veres, Miklós and Zolnai, Zsolt (2016) The use of ion beam techniques for the fabrication of integrated optical elements. In: 18th International Conference on Transparent Optical Networks (ICTON), 2016.07.10-2016.07.14, Trento.

Szilágyi, Edit and Bányász, István and Kótai, Endre and Németh, Attila and Major, Csaba and Fried, Miklós and Battistig, Gábor (2015) Determination of migration of ion-implanted Ar and Zn in silica by backscattering spectrometry. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 170 (3). pp. 229-237. ISSN 1042-0150

Fried, Miklós and Major, Csaba and Juhász, György and Petrik, Péter and Horváth, Zoltán György (2015) Expanded beam speetro-ellipsometry for big area on-line monitoring. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9525. pp. 1-12. ISSN 0277-786X

Petrik, Péter and Kumar, N. and Fried, Miklós and Fodor, Bálint and Juhász, György (2015) Fourier ellipsometry - An ellipsometric approach to Fourier scatterometry. JOURNAL OF THE EUROPEAN OPTICAL SOCIETY-RAPID PUBLICATIONS, 10. p. 15002. ISSN 1990-2573

Petrik, Péter and Agócs, Emil and Kalas, B. and Kozma, Péter and Fodor, Bálint and Nádor, Judit and Major, Csaba and Fried, Miklós (2015) Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9529. pp. 1-5. ISSN 0277-786X

Fodor, Bálint and Cayrel, F. and Agócs, Emil and Alquier, D. and Fried, Miklós and Petrik, Péter (2014) Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride. THIN SOLID FILMS, 571. pp. 567-572. ISSN 0040-6090

Dortu, Fabian and Bernier, Damien and Cestier, Isabelle and Vandormael, Denis and Emmerechts, Carl and Fodor, Bálint and Agócs, Emil and Petrik, Péter and Fried, Miklós (2014) Composite polymeric-inorganic waveguide fabricated by injection molding for biosensing applications. In: 16th International Conference on Transparent Optical Networks, ICTON 2014. International Conference on Transparent Optical Networks-ICTON . IEEE Computer Society, New York, pp. 1-4. ISBN 9781479956005

Nádor, Judit and Orgován, Norbert and Fried, Miklós and Petrik, Péter and Sulyok, Attila and Horváth, Róbert (2014) Enhanced protein adsorption and cellular adhesion using transparent titanate nanotube thin films made by a simple and inexpensive room temperature process: Application to optical biochips. COLLOIDS AND SURFACES B-BIOINTERFACES, 122. pp. 491-497. ISSN 0927-7765

Bányász, István and Zolnai, Zsolt and Fried, Miklós and Berneschi, S. and Pelli, S. (2014) Leaky mode suppression in planar optical waveguides written in Er:TeO2–WO3 glass and CaF2 crystal via double energy implantation with MeV N+ ions. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 321. pp. 81-85. ISSN 0168-583X

Fried, Miklós (2014) On-line monitoring of solar cell module production by ellipsometry technique. THIN SOLID FILMS, 571. pp. 345-355. ISSN 0040-6090

Petrik, Péter and Kumar, N. and Agócs, Emil and Fodor, Bálint and Pereira, S. F. and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of laterally and vertically structured oxides and semiconductors. In: 5th Annual Oxide Based Materials and Devices Conference. Proceedings of SPIE - The International Society for Optical Engineering (8987). SPIE, San Francisco, 89870E. ISBN 9780819499004

Petrik, Péter and Kumar, N and Juhász, György and Major, Csaba and Fodor, Bálint and Agócs, Emil and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of macro-, micro- and nanostructures using polarized light. JOURNAL OF PHYSICS-CONFERENCE SERIES, 558 (1). 012008. ISSN 1742-6588

Petrik, Péter and Agócs, Emil and Volk, János and Lukács, István Endre and Fodor, Bálint and Kozma, Péter and Lohner, Tivadar and Fried, Miklós (2014) Resolving lateral and vertical structures by ellipsometry using wavelength range scan. THIN SOLID FILMS, 571 (3). pp. 579-583. ISSN 0040-6090

Bányász, István and Fried, Miklós and Lohner, Tivadar and Conti, G. N. and Righini, G. C. and Pelli, S. and Zolnai, Zsolt (2013) M-line spectroscopic, spectroscopic ellipsometric and microscopic measurements of optical waveguides fabricated by MeV-energy N+ ion irradiation for telecom applications. THIN SOLID FILMS, 541. pp. 3-8. ISSN 0040-6090

Bányász, István and Zolnai, Zsolt and Fried, Miklós and Lohner, Tivadar and Berneschi, S. and Righini, GC. and Pelli, S. and Nunzi-Conti, G. (2013) Single- and double energy N+ ion irradiated planar optical waveguides in Er: Tungsten-tellurite oxide glass and sillenite type Bismuth Germanate crystals working up to telecommunications wavelengths. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 307. pp. 299-304. ISSN 0168-583X

Petrik, Péter and Gumprechte, T. and Nutscha, A. and Juhász, György and Polgár, Olivér and Major, Csaba and Kozma, Péter and Agócs, Emil and Fried, Miklós (2013) Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry. Thin Solid Films, 541. pp. 131-135. ISSN 0040-6090

Petrik, Péter and Fried, Miklós (2013) Ellipsometry of semiconductor nanocrystals. In: Ellipsometry at the nanoscale. Springer-Verlag, Berlin Heidelberg, pp. 583-606. ISBN 978-3-642-33956-1

Shan, Ambalanath and Fried, Miklós and Juhász, György and Major, Csaba and Polgár, Olivér and Németh, Ágoston and Petrik, Péter (2013) High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin Film Photovoltaics. IEEE JOURNAL OF PHOTOVOLTAICS, 4 (1). pp. 355-361. ISSN 2156-3381

Bányász, István and Zolnai, Zsolt and Pelli, S. and Berneschi, S. and Fried, Miklós and Lohner, Tivadar and Nunzi-Conti, G. and Righini, G. C. (2013) Single- and double-energy N+ - Irradiated planar waveguides in eulytine and sillenite type BGO crystals. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 8627. pp. 1-11. ISSN 0277-786X

Fried, Miklós and Lohner, Tivadar and Nguyen, Quoc Khanh (2008) Optikai modellek fejlesztése sokösszetevős anyagrendszerek ellipszometriai vizsgálatához = Optical model development for ellipsometric study of many-compound materials. Project Report. OTKA.

Fried, Miklós and Lohner, Tivadar and Nguyen, Quoc Khanh and Petrik, Péter (2008) Optikai modellek fejlesztése sokösszetevős anyagrendszerek ellipszometriai vizsgálatához = Optical model development for ellipsometric study of many-compound materials. Project Report. OTKA.

Horváth, Zsolt József and Basa, Péter and Petrik, Péter and Dücső, Csaba and Jászi, T. and Dobos, László and Tóth, Lajos and Lohner, Tivadar and Pécz, Béla and Fried, Miklós (2005) Si nanocrystals in sandwiched SiNx structures. In: Semiconductor nanocrystals. MTA MFA, Budapest, pp. 417-420. ISBN 963-7371-18-4