Robust and Versatile Black-Box Certification of Quantum Devices

Yang, Tzyh Haur and Vértesi, Tamás and Bancal, Jean-Daniel and Scarani, Valerio and Navascues, Miguel (2014) Robust and Versatile Black-Box Certification of Quantum Devices. PHYSICAL REVIEW LETTERS, 113 (4). ISSN 0031-9007

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Abstract

Self-testing refers to the fact that, in some quantum devices, both states and measurements can be assessed in a black-box scenario, on the sole basis of the observed statistics, i.e. without reference to any prior device calibration. Only a few examples of self-testing are known, and they just provide non-trivial assessment for devices performing unrealistically close to the ideal case. We overcome these difficulties by approaching self-testing with the semi-definite programming hierarchy for the characterization of quantum correlations. This allows us to improve dramatically the robustness of previous self-testing schemes -e.g.: we show that a CHSH violation larger than 2.57 certifies a singlet fidelity of more than 70%. In addition, the versatility of the tool brings about self-testing of hitherto impossible cases, such as robust self-testing of non-maximally entangled two-qutrit states in the CGLMP scenario.

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