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Items where Author is "Agócs, Emil"

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Article

Petrik, Péter and Sulyok, Attila and Novotny, Tamás and Perez-Feró, Erzsébet and Kalas, Benjamin and Agócs, Emil and Lohner, Tivadar and Nagy, Richárd and Menyhárd, Miklós and Hózer, Zoltán (2017) Optical properties of Zr and ZrO2. APPLIED SURFACE SCIENCE, 404. pp. 1-4. ISSN 0169-4332

Dabóczi, Mátyás and Albert, Emőke and Agócs, Emil and Kabai Jánosné Faix, Márta and Hórvölgyi, Zoltán (2016) Bilayered (silica-chitosan) coatings for studying dye release in aqueous media: The role of chitosan properties. Carbohydrate Polymers, 136. pp. 137-145. ISSN 0144-8617

Agócs, Emil and Kozma, Péter and Nádor, Judit and Hámori, András and Janosov, Milán and Kurunczi, Sándor and Fodor, Bálint and Fried, Miklós and Horváth, Róbert and Petrik, Péter (2016) Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions. Applied Surface Science. pp. 1-6. ISSN 0169-4332 (In Press)

Nádor, Judit and Kalas, Benjamin and Saftics, András and Agócs, Emil and Kozma, Péter and Kőrösi, László Tamás and Székács, Inna and Fried, Miklós and Horváth, Róbert (2016) Plasmon-enhanced two-channel in situ Kretschmann ellipsometry of protein adsorption, cellular adhesion and polyelectrolyte deposition on titania nanostructures. OPTICS EXPRESS, 24 (5). pp. 4812-4823. ISSN 1094-4087, ESSN: 1094-4087

Fodor, Bálint and Agócs, Emil and Bardet, Benjamin and Defforge, Thomas and Cayrel, Frederic and Fried, Miklós and Petrik, Péter (2016) Porosity and thickness characterization of porous Si and oxidized porous Si layers – an ultraviolet-visible-mid infrared ellipsometry study. MICROPOROUS and Mesoporous Materials, in pre. in press. ISSN 1387-1811

Fodor, Bálint and Defforge, Thomas and Agócs, Emil and Fried, Miklós and Gautier, Gaël and Petrik, Péter (2016) Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires. APPLIED SURFACE SCIENCE. pp. 1-8. ISSN 0169-4332

Chandrappan, Jayakrishnan and Murray, Matthew and Petrik, Péter and Agócs, Emil and Zolnai, Zsolt (2015) Doping silica beyond limits with laser plasma for active photonic materials. OPTICAL MATERIALS EXPRESS, 5 (12). pp. 2849-2861. ISSN 2159-3930

Petrik, Péter and Fodor, Bálint and Agócs, Emil and Kozma, Péter and Nádor, Judit and Juhász, György and Major, Csaba (2015) Methods for optical modeling and cross-checking in ellipsometry and scatterometry. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9526. pp. 1-11. ISSN 0277-786X (Unpublished)

Petrik, Péter and Agócs, Emil and Kalas, B. and Kozma, Péter and Fodor, Bálint and Nádor, Judit and Major, Csaba and Fried, Miklós (2015) Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9529. pp. 1-5. ISSN 0277-786X

Agócs, Emil and Bodermann, Brend and Burger, Sven and Dai, Gaoliang and Endres, Johannes (2015) Scatterometry reference standards to improve tool matching and traceability in lithographical nanomanufacturing. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9556. p. 955610. ISSN 0277-786X

Chandrappan, J. and Murray, M. and Kakkar, T. and Petrik, Péter and Agócs, Emil and Zolnai, Zsolt (2015) Target dependent femtosecond laser plasma implantation dynamics in enabling silica for high density erbium doping. SCIENTIFIC REPORTS, 5. pp. 1-8. ISSN 2045-2322

Agócs, Emil and Fodor, Bálint and Pollakowski, B. and Beckhoff, B. and Nutscha, A. and Petrik, Péter (2014) Approaches to calculate the dielectric function of ZnO around the band gap. THIN SOLID FILMS, 571. pp. 684-688. ISSN 0040-6090

Fodor, Bálint and Cayrel, F. and Agócs, Emil and Alquier, D. and Fried, Miklós and Petrik, Péter (2014) Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride. THIN SOLID FILMS, 571. pp. 567-572. ISSN 0040-6090

Petrik, Péter and Kumar, N and Juhász, György and Major, Csaba and Fodor, Bálint and Agócs, Emil and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of macro-, micro- and nanostructures using polarized light. JOURNAL OF PHYSICS-CONFERENCE SERIES, 558 (1). 012008. ISSN 1742-6588

Petrik, Péter and Agócs, Emil and Volk, János and Lukács, István Endre and Fodor, Bálint and Kozma, Péter and Lohner, Tivadar and Fried, Miklós (2014) Resolving lateral and vertical structures by ellipsometry using wavelength range scan. THIN SOLID FILMS, 571 (3). pp. 579-583. ISSN 0040-6090

Lohner, Tivadar and Agócs, Emil and Petrik, Péter and Zolnai, Zsolt and Szilágyi, Edit and Kovács, Imre and Szőkefalvi-Nagy, Zoltán and Tóth, Lajos and Tóth, Attila Lajos and Bársony, István (2014) Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration. THIN SOLID FILMS, 571 (3). pp. 715-719. ISSN 0040-6090

Petrik, Péter and Gumprechte, T. and Nutscha, A. and Juhász, György and Polgár, Olivér and Major, Csaba and Kozma, Péter and Agócs, Emil and Fried, Miklós (2013) Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry. Thin Solid Films, 541. pp. 131-135. ISSN 0040-6090

Petrik, Péter and Agócs, Emil (2013) High sensitivity optical characterization of thin films with embedded Si nanocrystals. ECS TRANSACTIONS, 53 (4). pp. 43-52. ISSN 1938-5862

Saftics, András and Agócs, Emil and Fodor, Bálint and Patkó, Dániel and Petrik, Péter and Fürjes, Péter and Horváth, Róbert and Kurunczi, Sándor (2013) Investigation of thin polymer layers for biosensor applications. APPLIED SURFACE SCIENCE, 281. pp. 66-72. ISSN 0169-4332

Agócs, Emil and Nassiopoulou, Androula G. and Milita, Silvia and Petrik, Péter (2013) Model dielectric function analysis of the critical point features of silicon nanocrystal films in a broad parameter range. THIN SOLID FILMS, 541. pp. 83-86. ISSN 0040-6090

Pramatarova, Lilyana D. and Hikov, Todor A. and Krasteva, Natalia A. and Petrik, Péter and Agócs, Emil (2013) Protein adsorption on detonation nanodiamond/polymer composite layers. MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, 1479. pp. 51-56. ISSN 0272-9172

Gubicza, Jenő and Lábár, János and Agócs, Emil and Fátay, D. and Lendvai, János (2008) Effect of nano-quasicrystals on viscosity of a Zr-based bulk metallic glass. Scripta Materialia, 58 (4). pp. 291-294. ISSN 1359-6462

Book Section

Petrik, Péter and Kumar, N. and Agócs, Emil and Fodor, Bálint and Pereira, S. F. and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of laterally and vertically structured oxides and semiconductors. In: 5th Annual Oxide Based Materials and Devices Conference. Proceedings of SPIE - The International Society for Optical Engineering (8987). SPIE, San Francisco, 89870E. ISBN 9780819499004

This list was generated on Tue May 30 12:57:00 2017 CEST.