Items where Author is "Lohner, Tivadar"

Petrik, Péter and Fried, Miklós and Lohner, Tivadar (2024) Optikai módszerek az MFA-ban. FIZIKAI SZEMLE : MAGYAR FIZIKAI FOLYÓIRAT, 74 (3). pp. 80-83. ISSN 0015-3257 (nyomtatott); 1588-0540 (elektronikus)

Lohner, Tivadar and Németh, Attila and Zolnai, Zsolt and Kalas, Benjamin and Romanenko, Alekszej and Nguyen Quoc, Khánh and Szilágyi, Edit and Kótai, Endre and Agócs, Emil and Tóth, Zsolt and Budai, Judit and Petrik, Péter and Fried, Miklós and Bársony, István and Gyulai, József (2022) Disorder and cavity evolution in single-crystalline Ge during implantation of Sb ions monitored in-situ by spectroscopic ellipsometry. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 152. No. 107062. ISSN 1369-8001

Lohner, Tivadar and Németh, Attila and Zolnai, Zsolt and Kalas, Benjamin and Romanenko, Alekszej and Nguyen Quoc, Khánh and Szilágyi, Edit and Kótai, Endre and Agócs, Emil and Petrik, Péter and Fried, Miklós and Bársony, István and Gyulai, József (2021) In-Situ Control of Defect Dynamics By Ellipsometry During Ion Implantation – Evolution of Disorder and Cavity Structure in Single-Crystalline Ge During Implantation of Sb Ions. SCIENTIFIC REPORTS, 11. ISSN 2045-2322

Lohner, Tivadar and Szilágyi, Edit and Zolnai, Zsolt and Németh, Attila and Fogarassy, Zsolt and Illés, Levente and Kótai, Endre and Petrik, Péter and Fried, Miklós (2020) Determination of the Complex Dielectric Function of Ion-Implanted Amorphous Germanium by Spectroscopic Ellipsometry. COATINGS, 10 (5). pp. 1-10. ISSN 2079-6412

Kalas, Benjamin and Zolnai, Zsolt and Sáfrán, György and Serényi, Miklós and Agócs, Emil and Lohner, Tivadar and Németh, Attila and Nguyen Quoc, Khánh and Fried, Miklós and Petrik, Péter (2020) Micro-combinatorial sampling of the optical properties of hydrogenated amorphous Si_{1-x}Ge_{x} for the entire range of compositions towards a database for optoelectronics. SCIENTIFIC REPORTS. ISSN 2045-2322

Petrik, Péter and Romanenko, Alekszej and Agócs, Emil and Kalas, Benjamin and Lohner, Tivadar and Perezné Feró, Erzsébet and Novotny, Tamás and Hózer, Zoltán (2019) Fűtőelemek cirkóniumburkolatának optikai felületvizsgálata. NUKLEON, 12 (7). pp. 32-35. ISSN 1789-9613

Petrik, Péter and Romanenko, Alekszej and Kalas, Benjamin and Péter, László and Novotny, Tamás and Perez-Feró, Erzsébet and Fodor, Bálint and Agócs, Emil and Lohner, Tivadar and Kurunczi, Sándor and Hózer, Zoltán (2019) Optical Properties of Oxidized, Hydrogenated, and Native Zirconium Surfaces for Wavelengths from 0.3 to 25 µm − A Study by Ex Situ and In Situ Spectroscopic Ellipsometry. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2019. ISSN 1862-6300

Lohner, Tivadar and Kalas, Benjámin and Petrik, Péter and Zolnai, Zsolt and Serényi, Miklós and Sáfrán, György (2018) Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory. APPLIED SCIENCES, 8 (5). pp. 1-7. ISSN 2076-3417

Petrik, Péter and Sulyok, Attila and Novotny, Tamás and Perez-Feró, Erzsébet and Kalas, Benjamin and Agócs, Emil and Lohner, Tivadar and Nagy, Richárd and Menyhárd, Miklós and Hózer, Zoltán (2017) Optical properties of Zr and ZrO2. APPLIED SURFACE SCIENCE, 404. pp. 1-4. ISSN 0169-4332

Serényi, Miklós and Lohner, Tivadar and Sáfrán, György and Szívós, János (2016) Comparison in formation, optical properties and applicability of DC magnetron and RF sputtered aluminum oxide films. VACUUM, 128. pp. 213-218. ISSN 0042-207X

Bányász, István and Pelli, S. and Nunzi-Conti, G. and Righini, G. C. and Berneschi, S. and Szilágyi, Edit and Fried, Miklós and Lohner, Tivadar and Petrik, Péter and Zolnai, Zsolt and Nguyen Quoc, Khánh and Veres, Miklós and Himics, László (2016) Design and fabrication of integrated optical elements in glasses and crystals by various ion beam techniques. In: 12th International Topical Meeting on Nuclear Applications of Accelerators (AccApp '15). American Nuclear Society, Kensington, pp. 389-415.

Lohner, Tivadar and Serényi, Miklós and Petrik, Péter (2016) Spectroellipsometric Characterization of Sputtered Silicon Nitride Films Using Two Different Dispersion Relations. INTERNATIONAL JOURNAL OF NEW HORIZONS IN PHYSICS, 3 (1). pp. 7-10. ISSN 2314-4564

Lohner, Tivadar and Serényi, Miklós and Szilágyi, Edit and Zolnai, Zsolt and Czigány, Zsolt and Nguyen Quoc, Khánh and Petrik, Péter and Fried, Miklós (2016) Spectroellipsometric detection of silicon substrate damage caused by radiofrequency sputtering of niobium oxide. APPLIED SURFACE SCIENCE. pp. 1-30. ISSN 0169-4332

Lohner, Tivadar and Serényi, Miklós and Petrik, Péter (2015) Characterization of sputtered aluminum oxide films using spectroscopic ellipsometry. INTERNATIONAL JOURNAL OF NEW HORIZONS IN PHYSICS, 2 (1). pp. 1-4. ISSN 2314-4564

Szívós, János and Serényi, Miklós and Gergely-Fülöp, Eszter and Lohner, Tivadar and Sáfrán, György (2015) UV LASER NANOPATTERNING OF Pt THIN FILMS. In: 12th Multinational Congress on Microscopy. Akadémiai Kiadó, Budapest, pp. 478-479. ISBN 978-963-05-9653-4

Szívós, János and Serényi, Miklós and Gergely-Fülöp, Eszter and Lohner, Tivadar and Sáfrán, György (2014) Nanopattern formation in UV laser treated a-AlOx and nc-Al/AlOx layers. VACUUM, 109. pp. 200-205. ISSN 0042-207X

Lohner, Tivadar and Jagadeesh Kumar, K. and Petrik, Péter and Subrahmanyam, Aryasomayajula and Bársony, István (2014) Optical analysis of room temperature magnetron sputtered ITO films by reflectometry and spectroscopic ellipsometry. Journal of Materials Research, 29 (14). pp. 1528-1536. ISSN 0884-2914 (print), 2044-5326 (online)

Petrik, Péter and Kumar, N. and Agócs, Emil and Fodor, Bálint and Pereira, S. F. and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of laterally and vertically structured oxides and semiconductors. In: 5th Annual Oxide Based Materials and Devices Conference. Proceedings of SPIE - The International Society for Optical Engineering (8987). SPIE, San Francisco, 89870E. ISBN 9780819499004

Petrik, Péter and Kumar, N and Juhász, György and Major, Csaba and Fodor, Bálint and Agócs, Emil and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of macro-, micro- and nanostructures using polarized light. JOURNAL OF PHYSICS-CONFERENCE SERIES, 558 (1). 012008. ISSN 1742-6588

Petrik, Péter and Agócs, Emil and Volk, János and Lukács, István Endre and Fodor, Bálint and Kozma, Péter and Lohner, Tivadar and Fried, Miklós (2014) Resolving lateral and vertical structures by ellipsometry using wavelength range scan. THIN SOLID FILMS, 571 (3). pp. 579-583. ISSN 0040-6090

Lohner, Tivadar and Agócs, Emil and Petrik, Péter and Zolnai, Zsolt and Szilágyi, Edit and Kovács, Imre and Szőkefalvi-Nagy, Zoltán and Tóth, Lajos and Tóth, Attila Lajos and Bársony, István (2014) Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration. THIN SOLID FILMS, 571 (3). pp. 715-719. ISSN 0040-6090

Bányász, István and Fried, Miklós and Lohner, Tivadar and Conti, G. N. and Righini, G. C. and Pelli, S. and Zolnai, Zsolt (2013) M-line spectroscopic, spectroscopic ellipsometric and microscopic measurements of optical waveguides fabricated by MeV-energy N+ ion irradiation for telecom applications. THIN SOLID FILMS, 541. pp. 3-8. ISSN 0040-6090

Bányász, István and Zolnai, Zsolt and Fried, Miklós and Lohner, Tivadar and Berneschi, S. and Righini, GC. and Pelli, S. and Nunzi-Conti, G. (2013) Single- and double energy N+ ion irradiated planar optical waveguides in Er: Tungsten-tellurite oxide glass and sillenite type Bismuth Germanate crystals working up to telecommunications wavelengths. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 307. pp. 299-304. ISSN 0168-583X

Bányász, István and Zolnai, Zsolt and Pelli, S. and Berneschi, S. and Fried, Miklós and Lohner, Tivadar and Nunzi-Conti, G. and Righini, G. C. (2013) Single- and double-energy N+ - Irradiated planar waveguides in eulytine and sillenite type BGO crystals. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 8627. pp. 1-11. ISSN 0277-786X

Lohner, Tivadar and Csíkvári, P. and Petrik, Péter and Hárs, György (2013) Spectroellipsometric characterization of nanocrystalline diamond layers. Applied Surface Science, 281. pp. 113-117. ISSN 0169-4332

Bakonyi, Imre and Lohner, Tivadar and Molnár, György and Neuróhr, Katalin and Pekker, Áron and Péter, László and Pogány, Lajos and Révész, Ádám and Szász, Krisztián and Tóth, Bence (2013) Óriás mágneses ellenállás (GMR) elektrolitikus multirétegekben = Giant magnetoresistance (GMR) in electrodeposited multilayers. Project Report. OTKA.

Serényi, Miklós and Lohner, Tivadar and Petrik, Péter and Zolnai, Zsolt and Horváth, Zsolt Endre and Nguyen Quoc, Khánh (2008) Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction. THIN SOLID FILMS, 516 (22). pp. 8096-8100. ISSN 0040-6090

Lohner, Tivadar and Serényi, Miklós and Basa, D.K. and Nguyen Quoc, Khánh and Nemcsics, Ákos and Petrik, Péter and Turmezei, Péter (2008) Composition and Thickness of RE Sputtered Amorphous Silicon Alloy Films. ACTA POLYTECHNICA HUNGARICA, 5 (2). pp. 23-30. ISSN 1785-8860

Basa, Péter and Alagoz, A. S. and Lohner, Tivadar and Kulakci, M. and Turan, R. and Horváth, Zsolt József (2008) Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals. APPLIED SURFACE SCIENCE, 254 (12). pp. 3626-3629. ISSN 0169-4332

Fried, Miklós and Lohner, Tivadar and Nguyen, Quoc Khanh (2008) Optikai modellek fejlesztése sokösszetevős anyagrendszerek ellipszometriai vizsgálatához = Optical model development for ellipsometric study of many-compound materials. Project Report. OTKA.

Fried, Miklós and Lohner, Tivadar and Nguyen, Quoc Khanh and Petrik, Péter (2008) Optikai modellek fejlesztése sokösszetevős anyagrendszerek ellipszometriai vizsgálatához = Optical model development for ellipsometric study of many-compound materials. Project Report. OTKA.

Serényi, Miklós and Lohner, Tivadar and Petrik, Péter and Frigeri, C. (2007) Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy. Thin Solid Films, 515 (7-8). pp. 3559-3562. ISSN 0040-6090

Gyulai, József and Arató, Péter and Balázsi, Csaba and Battistig, Gábor and Biró, László Péter and Hárs, György and Lábadi, Zoltán and Lohner, Tivadar and Makkai, Zsolt and Menyhárd, Miklós and Nguyen, Quoc Khanh and Pászti, Ferenc and Petrik, Péter and Ster, András and Tóth, Lajos and Vargáné dr. Josepovits, Katalin (2007) Ionsugaras módszerek a fizikai nanotechnológiában (IONNANO) = Ion beam modifications in near-to-physics nanotechnology. Project Report. OTKA.

Dózsa, László and Vo, Van Tuyen and Tóth, Attila Lajos and Somogyi, Károly and Lohner, Tivadar and Szentpáli, Béla (2007) SiC és más nagy tiltott sávú félvezető anyagok kutatása = Research of SiC and other wide band gap semiconductor materials. Project Report. OTKA.

Horváth, Zsolt József and Basa, Péter and Petrik, Péter and Dücső, Csaba and Jászi, T. and Dobos, László and Tóth, Lajos and Lohner, Tivadar and Pécz, Béla and Fried, Miklós (2005) Si nanocrystals in sandwiched SiNx structures. In: Semiconductor nanocrystals. MTA MFA, Budapest, pp. 417-420. ISBN 963-7371-18-4

Serényi, Miklós and Rácz, Miklós and Lohner, Tivadar (2001) Refractive index of sputtered silicon oxynitride layers for antireflection coating. VACUUM, 61 (2-4). pp. 245-249. ISSN 0042-207X