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Items where Author is "Lohner, Tivadar"

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Number of items: 11.

Lohner, Tivadar and Agócs, Emil and Petrik, Péter and Zolnai, Zsolt and Szilágyi, Edit and Kovács, Imre and Szőkefalvi-Nagy, Zoltán and Tóth, Lajos and Tóth, Attila Lajos and Bársony, István (2014) Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration. THIN SOLID FILMS, 550. ISSN 0040-6090 (In Press)

Bányász, István and Fried, Miklós and Lohner, Tivadar and Conti, G. N. and Righini, G. C. and Pelli, S. and Zolnai, Zsolt (2013) M-line spectroscopic, spectroscopic ellipsometric and microscopic measurements of optical waveguides fabricated by MeV-energy N+ ion irradiation for telecom applications. THIN SOLID FILMS, 541. pp. 3-8. ISSN 0040-6090

Bányász, István and Zolnai, Zsolt and Fried, Miklós and Lohner, Tivadar and Berneschi, S. and Righini, GC. and Pelli, S. and Nunzi-Conti, G. (2013) Single- and double energy N+ ion irradiated planar optical waveguides in Er: Tungsten-tellurite oxide glass and sillenite type Bismuth Germanate crystals working up to telecommunications wavelengths. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 307. pp. 299-304. ISSN 0168-583X

Bányász, István and Zolnai, Zsolt and Pelli, S. and Berneschi, S. and Fried, Miklós and Lohner, Tivadar and Nunzi-Conti, G. and Righini, G. C. (2013) Single- and double-energy N+ - Irradiated planar waveguides in eulytine and sillenite type BGO crystals. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 8627. pp. 1-11. ISSN 0277-786X

Lohner, Tivadar and Csíkvári, P. and Petrik, Péter and Hárs, György (2013) Spectroellipsometric characterization of nanocrystalline diamond layers. Applied Surface Science, 281. pp. 113-117. ISSN 0169-4332

Serényi, Miklós and Lohner, Tivadar and Petrik, Péter and Zolnai, Zsolt and Horváth, Zsolt Endre and Nguyen Quoc, Khánh (2008) Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction. THIN SOLID FILMS, 516 (22). pp. 8096-8100. ISSN 0040-6090

Lohner, Tivadar and Serényi, Miklós and Basa, D.K. and Nguyen Quoc, Khánh and Nemcsics, Ákos and Petrik, Péter and Turmezei, Péter (2008) Composition and Thickness of RE Sputtered Amorphous Silicon Alloy Films. ACTA POLYTECHNICA HUNGARICA, 5 (2). pp. 23-30. ISSN 1785-8860

Fried, Miklós and Lohner, Tivadar and Nguyen, Quoc Khanh (2008) Optikai modellek fejlesztése sokösszetevős anyagrendszerek ellipszometriai vizsgálatához = Optical model development for ellipsometric study of many-compound materials. Project Report. OTKA.

Serényi, Miklós and Lohner, Tivadar and Petrik, Péter and Frigeri, C. (2007) Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy. Thin Solid Films, 515 (7-8). pp. 3559-3562. ISSN 0040-6090

Gyulai, József and Arató, Péter and Balázsi, Csaba and Battistig, Gábor and Biró, László Péter and Hárs, György and Lábadi, Zoltán and Lohner, Tivadar and Makkai, Zsolt and Menyhárd, Miklós and Nguyen, Quoc Khanh and Pászti, Ferenc and Petrik, Péter and Ster, András and Tóth, Lajos and Vargáné dr. Josepovits, Katalin (2007) Ionsugaras módszerek a fizikai nanotechnológiában (IONNANO) = Ion beam modifications in near-to-physics nanotechnology. Project Report. OTKA.

Dózsa, László and Vo, Van Tuyen and Tóth, Attila Lajos and Somogyi, Károly and Lohner, Tivadar and Szentpáli, Béla (2007) SiC és más nagy tiltott sávú félvezető anyagok kutatása = Research of SiC and other wide band gap semiconductor materials. Project Report. OTKA.

This list was generated on Wed Apr 23 14:31:50 2014 CEST.