Items where Author is "Agócs, Emil"
Group by: Item Type | No Grouping Jump to: Article | Book Section Number of items: 40. ArticleRomanenko, Alekszej and Agócs, Emil and Hózer, Zoltán and Petrik, Péter and Serényi, Miklós (2022) Concordant Element of the Oxidation Kinetics - Interpretation of Ellipsometric Measurements on Zr. APPLIED SURFACE SCIENCE : A JOURNAL DEVOTED TO APPLIED PHYSICS AND CHEMISTRY OF SURFACES AND INTERFACES, 573. pp. 1-8. ISSN 0169-4332 (print); 1873-5584 (online) Lohner, Tivadar and Németh, Attila and Zolnai, Zsolt and Kalas, Benjamin and Romanenko, Alekszej and Nguyen Quoc, Khánh and Szilágyi, Edit and Kótai, Endre and Agócs, Emil and Tóth, Zsolt and Budai, Judit and Petrik, Péter and Fried, Miklós and Bársony, István and Gyulai, József (2022) Disorder and cavity evolution in single-crystalline Ge during implantation of Sb ions monitored in-situ by spectroscopic ellipsometry. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 152. No. 107062. ISSN 1369-8001 Baji, Zsófia and Cora, Ildikó and Horváth, Zsolt Endre and Agócs, Emil and Szabó, Zoltán (2021) Atomic layer deposition and characterization of Zn-doped Ga2O3 films. JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY A-VACUUM SURFACES AND FILMS, 39 (3). ISSN 0734-2101 Lohner, Tivadar and Németh, Attila and Zolnai, Zsolt and Kalas, Benjamin and Romanenko, Alekszej and Nguyen Quoc, Khánh and Szilágyi, Edit and Kótai, Endre and Agócs, Emil and Petrik, Péter and Fried, Miklós and Bársony, István and Gyulai, József (2021) In-Situ Control of Defect Dynamics By Ellipsometry During Ion Implantation – Evolution of Disorder and Cavity Structure in Single-Crystalline Ge During Implantation of Sb Ions. SCIENTIFIC REPORTS, 11. ISSN 2045-2322 Rim, Min-Ho and Agócs, Emil and Dixson, Ronald and Kavuri, Prem and Vladár, András E. and Attota, Ravi Kiran (2020) Detecting nanoscale contamination in semiconductor fabrication using through-focus scanning optical microscopy. JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY B: NANOTECHNOLOGY AND MICROELECTRONICS, 38 (5). pp. 1-6. ISSN 2166-2746 (print); 2166-2754 (online) Kalas, Benjamin and Zolnai, Zsolt and Sáfrán, György and Serényi, Miklós and Agócs, Emil and Lohner, Tivadar and Németh, Attila and Nguyen Quoc, Khánh and Fried, Miklós and Petrik, Péter (2020) Micro-combinatorial sampling of the optical properties of hydrogenated amorphous Si_{1-x}Ge_{x} for the entire range of compositions towards a database for optoelectronics. SCIENTIFIC REPORTS. ISSN 2045-2322 Petrik, Péter and Romanenko, Alekszej and Agócs, Emil and Kalas, Benjamin and Lohner, Tivadar and Perezné Feró, Erzsébet and Novotny, Tamás and Hózer, Zoltán (2019) Fűtőelemek cirkóniumburkolatának optikai felületvizsgálata. NUKLEON, 12 (7). pp. 32-35. ISSN 1789-9613 Kalas, Benjamin and Agócs, Emil and Romanenko, Alekszej and Petrik, Péter (2019) In Situ Characterization of Biomaterials at Solid-Liquid Interfaces Using Ellipsometry in the UV-Visible-NIR Wavelength Range. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2019. ISSN 1862-6300 Petrik, Péter and Romanenko, Alekszej and Kalas, Benjamin and Péter, László and Novotny, Tamás and Perez-Feró, Erzsébet and Fodor, Bálint and Agócs, Emil and Lohner, Tivadar and Kurunczi, Sándor and Hózer, Zoltán (2019) Optical Properties of Oxidized, Hydrogenated, and Native Zirconium Surfaces for Wavelengths from 0.3 to 25 µm − A Study by Ex Situ and In Situ Spectroscopic Ellipsometry. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2019. ISSN 1862-6300 Agócs, Emil and Attota, Ravi Kiran (2018) Enhancing optical microscopy illumination to enable quantitative imaging. SCIENTIFIC REPORTS, 8. ISSN 2045-2322 Agócs, Emil and Zolnai, Zsolt and Rossall, A. K. and Berg, J. A. van den and Fodor, Bálint and Kalas, Benjamin and Petrik, Péter (2017) Optical and structural characterization of Ge clusters embedded in ZrO2. APPLIED SURFACE SCIENCE, 421. pp. 283-288. ISSN 0169-4332 Petrik, Péter and Sulyok, Attila and Novotny, Tamás and Perez-Feró, Erzsébet and Kalas, Benjamin and Agócs, Emil and Lohner, Tivadar and Nagy, Richárd and Menyhárd, Miklós and Hózer, Zoltán (2017) Optical properties of Zr and ZrO2. APPLIED SURFACE SCIENCE, 404. pp. 1-4. ISSN 0169-4332 Kalas, Benjamin and Nádor, Judit and Agócs, Emil and Saftics, András and Kurunczi, S. and Fried, Miklós and Petrik, Péter (2017) Protein adsorption monitored by plasmon-enhanced semi-cylindrical Kretschmann ellipsometry. APPLIED SURFACE SCIENCE, 421. pp. 585-592. ISSN 0169-4332 Saftics, András and Kurunczi, Sándor and Türk, Barbara and Agócs, Emil and Kalas, Benjamin and Petrik, Péter and Fried, Miklós and Sulyok, Attila and Horváth, Róbert (2017) SPIN COATED CARBOXYMETHY L DEXTRAN LAYERS ON TiO 2 -SiO 2 OPTICAL WAVEGUIDE SURFACES. REVUE ROUMAINE DE CHIMIE, 62 (10). pp. 775-782. ISSN 0035-3930 Dabóczi, Mátyás and Albert, Emőke and Agócs, Emil and Kabai Jánosné Faix, Márta and Hórvölgyi, Zoltán (2016) Bilayered (silica-chitosan) coatings for studying dye release in aqueous media: The role of chitosan properties. Carbohydrate Polymers, 136. pp. 137-145. ISSN 0144-8617 Agócs, Emil and Kozma, Péter and Nádor, Judit and Hámori, András and Janosov, Milán and Kurunczi, Sándor and Fodor, Bálint and Fried, Miklós and Horváth, Róbert and Petrik, Péter (2016) Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions. Applied Surface Science. pp. 1-6. ISSN 0169-4332 (In Press) Nádor, Judit and Kalas, Benjamin and Saftics, András and Agócs, Emil and Kozma, Péter and Kőrösi, László Tamás and Székács, Inna and Fried, Miklós and Horváth, Róbert (2016) Plasmon-enhanced two-channel in situ Kretschmann ellipsometry of protein adsorption, cellular adhesion and polyelectrolyte deposition on titania nanostructures. OPTICS EXPRESS, 24 (5). pp. 4812-4823. ISSN 1094-4087, ESSN: 1094-4087 Fodor, Bálint and Agócs, Emil and Bardet, Benjamin and Defforge, Thomas and Cayrel, Frederic and Fried, Miklós and Petrik, Péter (2016) Porosity and thickness characterization of porous Si and oxidized porous Si layers – an ultraviolet-visible-mid infrared ellipsometry study. MICROPOROUS and Mesoporous Materials, in pre. in press. ISSN 1387-1811 Fodor, Bálint and Defforge, Thomas and Agócs, Emil and Fried, Miklós and Gautier, Gaël and Petrik, Péter (2016) Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires. APPLIED SURFACE SCIENCE. pp. 1-8. ISSN 0169-4332 Jose, Gin and Chandrappan, Jayakrishnan and Suraya, Ahmad Kamil and Murray, Matthew and Zolnai, Zsolt and Agócs, Emil and Petrik, Péter (2016) Ultrafast laser plasma assisted rare-earth doping for silicon photonics. CONFERENCE ON LASERS AND ELECTRO-OPTICS, 2016. ISSN 2160-9020 Chandrappan, Jayakrishnan and Murray, Matthew and Petrik, Péter and Agócs, Emil and Zolnai, Zsolt (2015) Doping silica beyond limits with laser plasma for active photonic materials. OPTICAL MATERIALS EXPRESS, 5 (12). pp. 2849-2861. ISSN 2159-3930 Petrik, Péter and Fodor, Bálint and Agócs, Emil and Kozma, Péter and Nádor, Judit and Juhász, György and Major, Csaba (2015) Methods for optical modeling and cross-checking in ellipsometry and scatterometry. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9526. pp. 1-11. ISSN 0277-786X (Unpublished) Petrik, Péter and Agócs, Emil and Kalas, B. and Kozma, Péter and Fodor, Bálint and Nádor, Judit and Major, Csaba and Fried, Miklós (2015) Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9529. pp. 1-5. ISSN 0277-786X Agócs, Emil and Bodermann, Brend and Burger, Sven and Dai, Gaoliang and Endres, Johannes (2015) Scatterometry reference standards to improve tool matching and traceability in lithographical nanomanufacturing. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9556. p. 955610. ISSN 0277-786X Chandrappan, J. and Murray, M. and Kakkar, T. and Petrik, Péter and Agócs, Emil and Zolnai, Zsolt (2015) Target dependent femtosecond laser plasma implantation dynamics in enabling silica for high density erbium doping. SCIENTIFIC REPORTS, 5. pp. 1-8. ISSN 2045-2322 Agócs, Emil and Fodor, Bálint and Pollakowski, B. and Beckhoff, B. and Nutscha, A. and Petrik, Péter (2014) Approaches to calculate the dielectric function of ZnO around the band gap. THIN SOLID FILMS, 571. pp. 684-688. ISSN 0040-6090 Fodor, Bálint and Cayrel, F. and Agócs, Emil and Alquier, D. and Fried, Miklós and Petrik, Péter (2014) Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride. THIN SOLID FILMS, 571. pp. 567-572. ISSN 0040-6090 Petrik, Péter and Kumar, N and Juhász, György and Major, Csaba and Fodor, Bálint and Agócs, Emil and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of macro-, micro- and nanostructures using polarized light. JOURNAL OF PHYSICS-CONFERENCE SERIES, 558 (1). 012008. ISSN 1742-6588 Petrik, Péter and Agócs, Emil and Volk, János and Lukács, István Endre and Fodor, Bálint and Kozma, Péter and Lohner, Tivadar and Fried, Miklós (2014) Resolving lateral and vertical structures by ellipsometry using wavelength range scan. THIN SOLID FILMS, 571 (3). pp. 579-583. ISSN 0040-6090 Lohner, Tivadar and Agócs, Emil and Petrik, Péter and Zolnai, Zsolt and Szilágyi, Edit and Kovács, Imre and Szőkefalvi-Nagy, Zoltán and Tóth, Lajos and Tóth, Attila Lajos and Bársony, István (2014) Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration. THIN SOLID FILMS, 571 (3). pp. 715-719. ISSN 0040-6090 Petrik, Péter and Gumprechte, T. and Nutscha, A. and Juhász, György and Polgár, Olivér and Major, Csaba and Kozma, Péter and Agócs, Emil and Fried, Miklós (2013) Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry. Thin Solid Films, 541. pp. 131-135. ISSN 0040-6090 Petrik, Péter and Agócs, Emil (2013) High sensitivity optical characterization of thin films with embedded Si nanocrystals. ECS TRANSACTIONS, 53 (4). pp. 43-52. ISSN 1938-5862 Saftics, András and Agócs, Emil and Fodor, Bálint and Patkó, Dániel and Petrik, Péter and Fürjes, Péter and Horváth, Róbert and Kurunczi, Sándor (2013) Investigation of thin polymer layers for biosensor applications. APPLIED SURFACE SCIENCE, 281. pp. 66-72. ISSN 0169-4332 Agócs, Emil and Nassiopoulou, Androula G. and Milita, Silvia and Petrik, Péter (2013) Model dielectric function analysis of the critical point features of silicon nanocrystal films in a broad parameter range. THIN SOLID FILMS, 541. pp. 83-86. ISSN 0040-6090 Pramatarova, Lilyana D. and Hikov, Todor A. and Krasteva, Natalia A. and Petrik, Péter and Agócs, Emil (2013) Protein adsorption on detonation nanodiamond/polymer composite layers. MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, 1479. pp. 51-56. ISSN 0272-9172 Gubicza, Jenő and Lábár, János and Agócs, Emil and Fátay, D. and Lendvai, János (2008) Effect of nano-quasicrystals on viscosity of a Zr-based bulk metallic glass. Scripta Materialia, 58 (4). pp. 291-294. ISSN 1359-6462 Book SectionSaftics, András and Türk, Barbara and Sulyok, Attila and Nagy, Norbert and Agócs, Emil and Kalas, Benjamin and Petrik, Péter and Fried, Miklós and Nguyen Quoc, Khánh and Kamarás, Katalin and Székács, Inna and Horváth, Róbert and Kurunczi, Sándor (2020) Dextran-based Hydrogel Layers for Biosensors. In: Nanobiomaterial Engineering. Springer Singapore, Singapore, pp. 139-164. ISBN 9789813298408; 9789813298392 Bányász, István and Nagy, G.U.L. and Havranek, V. and Vosecek, V. and Agócs, Emil and Fried, Miklós and Rakovics, Vilmos (2017) Recent progress in ion beam fabrication of integrated optical elements. In: 19th International Conference on Transparent Optical Networks, ICTON 2017. International Conference on Transparent Optical Networks . IEEE Computer Society, Washington, p. 8024871. ISBN 9781538608586 Dortu, Fabian and Bernier, Damien and Cestier, Isabelle and Vandormael, Denis and Emmerechts, Carl and Fodor, Bálint and Agócs, Emil and Petrik, Péter and Fried, Miklós (2014) Composite polymeric-inorganic waveguide fabricated by injection molding for biosensing applications. In: 16th International Conference on Transparent Optical Networks, ICTON 2014. International Conference on Transparent Optical Networks-ICTON . IEEE Computer Society, New York, pp. 1-4. ISBN 9781479956005 Petrik, Péter and Kumar, N. and Agócs, Emil and Fodor, Bálint and Pereira, S. F. and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of laterally and vertically structured oxides and semiconductors. In: 5th Annual Oxide Based Materials and Devices Conference. Proceedings of SPIE - The International Society for Optical Engineering (8987). SPIE, San Francisco, 89870E. ISBN 9780819499004 |