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Items where Author is "Petrik, Péter"

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Lábadi, Zoltán and Takács, Dániel and Zolnai, Zsolt and Petrik, Péter and Fried, Miklós (2024) Compositional Optimization of Sputtered WO3/MoO3 Films for High Coloration Efficiency. MATERIALS, 17 (5). No.-1000. ISSN 1996-1944

Nguyen Quoc, Khánh and Horváth, Zsolt Endre and Zolnai, Zsolt and Petrik, Péter and Pósa, László and Volk, János (2024) Effect of Process Parameters on Co-Sputtered Al(1-x)ScxN Layer's Properties: Morphology, Crystal Structure, Strain, Band Gap, and Piezoelectricity. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING : FUNCTIONAL MATERIALS FOR (OPTO)ELECTRONICS, SENSORS, DETECTORS, AND GREEN ENERGY, 169. No.-107902. ISSN 1369-8001 (print); 1873-4081 (online)

Chou, Ta-Shun and Bin Anooz, Saud and Grüneberg, Raimund and Rehm, Jana and Akhtar, Arub and Mukherjee, Deshabrato and Petrik, Péter and Popp, Andreas (2024) In-situ spectral reflectance investigation of hetero-epitaxially grown β-Ga2O3 thin films on c-plane Al2O3 via MOVPE process. APPLIED SURFACE SCIENCE, 652. No-159370. ISSN 0169-4332

Renkó, József Bálint and Romanenko, Alekszej and Bíró, Tamás and Szabó, Péter János and Petrik, Péter and Bonyár, Attila (2024) Investigating the kinetics of layer development during the color etching of low-carbon steel with in-situ spectroscopic ellipsometry. HELIYON, 10 (3). ISSN 2405-8440

Petrik, Péter and Fried, Miklós and Lohner, Tivadar (2024) Optikai módszerek az MFA-ban. FIZIKAI SZEMLE : MAGYAR FIZIKAI FOLYÓIRAT, 74 (3). pp. 80-83. ISSN 0015-3257 (nyomtatott); 1588-0540 (elektronikus)

Lábadi, Zoltán and Bakos, Csaba and Szucs, Mate and Bonyár, Attila and Mukherjee, Deshabrato and Jankovics, Hajnalka and Vonderviszt, Ferenc and Petrik, Péter (2023) Ellipsometry monitoring of sensor processes based on gold nanoparticle bonded proteins. PROGRESS IN BIOMEDICAL OPTICS AND IMAGING (PROCEEDINGS OF SPIE). ISSN 1605-7422

Ismaeel, Noor T. and Lábadi, Zoltán and Petrik, Péter and Fried, Miklós (2023) Investigation of Electrochromic, Combinatorial TiO2-SnO2 Mixed Layers by Spectroscopic Ellipsometry Using Different Optical Models. MATERIALS, 16 (12). ISSN 1996-1944

Merkel, Dániel and Sájerman, K. and Váczi, Tamás and Lenk, Sándor and Hegedűs, Gergő and Sajti, Szilárd Mihály and Németh, Attila and Gracheva, Maria and Petrik, Péter and Mukherjee, Deshabrato and Horváth, Zsolt Endre and Nagy, Dénes Lajos and Lengyel, Attila (2023) Laser irradiation effects in FeRh thin film. MATERIALS RESEARCH EXPRESS, 10 (7). ISSN 2053-1591

Nugusse, Berhane and Juhász, György and Major, Csaba and Petrik, Péter and Kálvin, Sándor and Horváth, Zoltán György and Fried, Miklós (2023) Multi-Color Ellipsometric Mapping Tool from Cheap Parts. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 12428. pp. 134-141. ISSN 0277-786X (print); 1996-756X (online)

Mukherjee, Deshabrato and Kalas, Benjamin and Burger, Sven and Sáfrán, György and Serényi, Miklós and Fried, Miklós and Petrik, Péter (2023) Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry. In: Photonic Instrumentation Engineering X. International Society for Optics and Photonics, pp. 206-214. ISBN 9781510659612; 9781510659629

Alkhalil, George and Burunkova, Julia A. and Csík, Attila and Döncző, Boglárka and Szarka, Máté and Petrik, Péter and Kökényesi, Sándor Jenő and Saadaldin, Nasser (2023) Photoinduced structural transformations of Au-As2S3 nanocomposite impregnated in silica porous glass matrix. JOURNAL OF NON-CRYSTALLINE SOLIDS, 610. ISSN 0022-3093

Mukherjee, Deshabrato and Petrik, Péter (2023) Real-Time Ellipsometry at High and Low Temperatures. ACS OMEGA. pp. 1-14. ISSN 2470-1343 (In Press)

Sáfrán, György and Petrik, Péter and Szász, Noémi and Olasz, Dániel and Nguyen Quang, Chinh and Serényi, Miklós (2023) Review on High-Throughput Micro-Combinatorial Characterization of Binary and Ternary Layers towards Databases. MATERIALS, 16 (8). ISSN 1996-1944

Renkó, József Bálint and Romanenko, Alekszej and Szabó, Péter János and Sulyok, Attila and Petrik, Péter and Bonyar, Attila (2022) Analysis of Structural and Chemical Inhomogeneity of Thin Films Developed on Ferrite Grains by Color Etching with Beraha-I Type Etchant with Spectroscopic Ellipsometry and XPS. JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY : OFFICIAL PUBLICATION OF THE BRAZILIAN METALLURGICAL, MATERIALS AND MINING ASSOCIATION, 18. pp. 2822-2830. ISSN 2238-7854 (print); 2214-0697 (online)

Zaharescu, Maria and Anastasescu, Mihai and Stroescu, Hermine and Calderón-Moreno, José M. and Apostol, Nicoleta and Preda, Silviu and Vladut, Cristina Maria and Mihaiu, Susana and Petrik, Péter and Gartner, Mariuca (2022) Comparative Study of the Dopants (Mn vs. V) Influence on the Properties of Sol-Gel ZnO Films. JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY : A JOURNAL DEVOTED TO SOL-GEL AND SOLUTION DERIVED INORGANIC AND HYBRID MATERIALS. pp. 1-11. ISSN 0928-0707 (print); 1573-4846 (online)

Romanenko, Alekszej and Agócs, Emil and Hózer, Zoltán and Petrik, Péter and Serényi, Miklós (2022) Concordant Element of the Oxidation Kinetics - Interpretation of Ellipsometric Measurements on Zr. APPLIED SURFACE SCIENCE : A JOURNAL DEVOTED TO APPLIED PHYSICS AND CHEMISTRY OF SURFACES AND INTERFACES, 573. pp. 1-8. ISSN 0169-4332 (print); 1873-5584 (online)

Kalas, Benjámin and Defforge, Thomas and Gautier, Gaël and Chaix, Arnaud and Fried, Miklós and Petrik, Péter (2022) Development of Advanced Sensing Materials and Interface Structures for In-Situ Bioellipsometry. In: Label-free Biomedical Imaging and Sensing (SPIE BIOS 2022), 2022. március 2., San Francisco (CA).

Defforge, Thomas and Chaix, Arnaud and Kalas, Benjámin and Fried, Miklós and Petrik, Péter (2022) Development of Silicon Nanoparticles for Plasmonic Sensing. In: Colloidal Nanoparticles for Biomedical Applications XVII (SPIE BIOS 2022), 2022. március 3., San Francisco (CA).

Lohner, Tivadar and Németh, Attila and Zolnai, Zsolt and Kalas, Benjamin and Romanenko, Alekszej and Nguyen Quoc, Khánh and Szilágyi, Edit and Kótai, Endre and Agócs, Emil and Tóth, Zsolt and Budai, Judit and Petrik, Péter and Fried, Miklós and Bársony, István and Gyulai, József (2022) Disorder and cavity evolution in single-crystalline Ge during implantation of Sb ions monitored in-situ by spectroscopic ellipsometry. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 152. No. 107062. ISSN 1369-8001

Bonyár, Attila and Szalóki, Melinda and Borók, Alexandra and Rigó, István and Kámán, Judit and Zangana, Shereen and Veres, Miklós and Rácz, Péter and Aladi, Márk and Kedves, Miklós Ákos and Szokol, Ágnes and Petrik, Péter and Fogarassy, Zsolt and Molnár, Kolos and Csete, Mária and Szenes, András and Tóth, Emese and Vas, Dávid and Papp, István and Galbács, Gábor and Csernai, László P. and Biró, Tamás S. and Kroó, Norbert (2022) The Effect of Femtosecond Laser Irradiation and Plasmon Field on the Degree of Conversion of a UDMA-TEGDMA Copolymer Nanocomposite Doped with Gold Nanorods. INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES, 23 (21). pp. 1-16. ISSN 1661-6596 (print); 1422-0067 (online)

Bin Anooz, S. and Wang, Y. and Petrik, Péter and de Oliveira Guimaraes, M. and Schmidbauer, M. (2022) High temperature phase transitions in NaNbO 3 epitaxial films grown under tensile lattice strain. APPLIED PHYSICS LETTERS, 120 (20). No. 202901. ISSN 0003-6951

Hegedüs, Nikolett and Lovics, Riku and Serényi, Miklós and Zolnai, Zsolt and Petrik, Péter and Balázsi, Csaba and Balázsi, Katalin (2022) Interpretation of hydrogen incorporation into radio frequency sputtered amorphous silicon based on Berg modelling. VACUUM, 202. No.-111164. ISSN 0042-207X

Baji, Zsófia and Fogarassy, Zsolt and Sulyok, Attila and Petrik, Péter (2022) Investigation of the Tetrakis(dimethylamino)hafnium and H2S ALD Process: Effects of Deposition Temperature and Annealing. SOLIDS, 3 (2). pp. 258-270. ISSN 2673-6497

Petrik, Péter and Fried, Miklós (2022) Mapping and imaging of thin films on large surfaces. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. ISSN 1862-6300 (In Press)

Gartner, Mariuca and Anastasescu, Mihai and Calderón-Moreno, José Maria and Nicolescu, Madalina and Stroescu, Hermine and Petrik, Péter (2022) Multifunctional Zn-Doped ITO Sol–Gel Films Deposited on Different Substrates: Application as CO2-Sensing Material. NANOMATERIALS, 12 (18). pp. 1-20. ISSN 2079-4991

Kalas, Benjámin and Sáfrán, György and Serényi, Miklós and Fried, Miklós and Petrik, Péter (2022) Scanning-Resonance Optical Sensing based on a Laterally Graded Plasmonic Layer – Optical Properties of Ag x Al 1 − x in the Range of x = 0 to 1. APPLIED SURFACE SCIENCE : A JOURNAL DEVOTED TO APPLIED PHYSICS AND CHEMISTRY OF SURFACES AND INTERFACES. pp. 1-38. ISSN 0169-4332 (print); 1873-5584 (online) (In Press)

Budai, Judit and Pápa, Zsuzsanna and Petrik, Péter and Dombi, Péter (2022) Ultrasensitive Probing of Plasmonic Hot Electron Occupancies. NATURE COMMUNICATIONS, 13. pp. 1-6. ISSN 2041-1723

Pálinkás, András and Kálvin, György and Vancsó, Péter and Kandrai, Konrád and Szendrő, Márton and Pekker, Áron and Petrik, Péter and Kamarás, Katalin and Tapasztó, Levente and Nemes Incze, Péter (2022) The composition and structure of the ubiquitous hydrocarbon contamination on van der Waals materials. NATURE COMMUNICATIONS, 13 (1). ISSN 2041-1723

Kalas, Benjamin and Ferencz, Kárpát and Saftics, András and Czigány, Zsolt and Fried, Miklós and Petrik, Péter (2021) Bloch surface waves biosensing in the ultraviolet wavelength range – Bragg structure design for investigating protein adsorption by in situ Kretschmann-Raether ellipsometry. APPLIED SURFACE SCIENCE, 536. ISSN 0169-4332

Hegedüs, Nikolett and Lovics, Riku and Serényi, Miklós and Zolnai, Zsolt and Petrik, Péter and Mihály, Judit and Fogarassy, Zsolt and Balázsi, Csaba and Balázsi, Katalin (2021) Examination of the Hydrogen Incorporation into Radio Frequency-Sputtered Hydrogenated SiNx Thin Films. COATINGS, 11 (1). pp. 1-13. ISSN 2079-6412

Jankovics, Hajnalka and Szekér, P. and Tóth, Éva and Kakasi, Balázs and Lábadi, Zoltán and Saftics, András and Kalas, Benjamin and Fried, Miklós and Petrik, Péter and Vonderviszt, Ferenc (2021) Flagellin-based electrochemical sensing layer for arsenic detection in water. SCIENTIFIC REPORTS, 11 (1). ISSN 2045-2322

Lohner, Tivadar and Németh, Attila and Zolnai, Zsolt and Kalas, Benjamin and Romanenko, Alekszej and Nguyen Quoc, Khánh and Szilágyi, Edit and Kótai, Endre and Agócs, Emil and Petrik, Péter and Fried, Miklós and Bársony, István and Gyulai, József (2021) In-Situ Control of Defect Dynamics By Ellipsometry During Ion Implantation – Evolution of Disorder and Cavity Structure in Single-Crystalline Ge During Implantation of Sb Ions. SCIENTIFIC REPORTS, 11. ISSN 2045-2322

Dobrik, Gergely and Nemes-Incze, Péter and Majerus, Bruno and Süle, Péter and Vancsó, Péter and Piszter, Gábor and Menyhárd, Miklós and Kalas, Benjámin and Petrik, Péter and Tapasztó, Levente (2021) Large-area nanoengineering of graphene corrugations hosting visible-frequency graphene plasmons. NATURE NANOTECHNOLOGY. pp. 1-18. ISSN 1748-3387 (print); 1748-3395 (online) (In Press)

Bukovinszky, Katalin and Szalóki, Melinda and Csarnovics, István and Bonyár, Attila and Petrik, Péter and Kalas, Benjámin and Daróczi, Lajos and Kéki, Sándor and Kökényesi, Sándor and Hegedűs, Csaba (2021) Optimization of Plasmonic Gold Nanoparticle Concentration in Green LED Light Active Dental Photopolymer. POLYMERS, 13 (2). pp. 1-17. ISSN 2073-4360

Bukovinszky, Katalin and Szalóki, Melinda and Csarnovics, István and Bonyár, Attila and Petrik, Péter and Kalas, Benjámin and Daróczi, Lajos and Kéki, Sándor and Kökényesi, Sándor and Hegedűs, Csaba (2021) Optimization of Plasmonic Gold Nanoparticle Concentration in Green LED Light Active Dental Photopolymer. POLYMERS, 13 (2). p. 275. ISSN 2073-4360

Pósa, László and Molnár, György and Kalas, Benjamin and Baji, Zsófia and Czigány, Zsolt and Petrik, Péter and Volk, János (2021) A Rational Fabrication Method for Low Switching-Temperature VO2. NANOMATERIALS, 11 (1). ISSN 2079-4991

Renkó, József Bálint and Romanenko, Alekszej and Szabó, Péter János and Petrik, Péter and Bonyár, Attila (2021) Színesen mart ferrites acél vizsgálata spektroszkópiai ellipszometriával. BÁNYÁSZATI ÉS KOHÁSZATI LAPOK-KOHÁSZAT, 154. (3-4). pp. 32-36. ISSN 0005-5670

Stoever, Julian and Boschker, Jos E. and Anooz, Saud Bin and Schmidbauer, Martin and Petrik, Péter (2020) Approaching the High Intrinsic Electrical Resistivity of NbO2 in Epitaxially Grown Films. APPLIED PHYSICS LETTERS, 116. pp. 1-8. ISSN 0003-6951 (print); 1077-3118 (online)

Petrik, Péter and Rácz, Adél Sarolta and Menyhárd, Miklós (2020) Complementary physicochemical analysis by ellipsometry and Auger spectroscopy of nano-sized protective coating layers. APPLIED SURFACE SCIENCE, 534. ISSN 0169-4332

Juhász, Laura and Parditka, Bence and Petrik, Péter and Cserháti, Csaba and Erdélyi, Zoltán (2020) Continuous tuning of the plasmon resonance frequency of porous gold nanoparticles by mixed oxide layers. JOURNAL OF POROUS MATERIALS. ISSN 1380-2224

Lohner, Tivadar and Szilágyi, Edit and Zolnai, Zsolt and Németh, Attila and Fogarassy, Zsolt and Illés, Levente and Kótai, Endre and Petrik, Péter and Fried, Miklós (2020) Determination of the Complex Dielectric Function of Ion-Implanted Amorphous Germanium by Spectroscopic Ellipsometry. COATINGS, 10 (5). pp. 1-10. ISSN 2079-6412

Saftics, András and Türk, Barbara and Sulyok, Attila and Nagy, Norbert and Agócs, Emil and Kalas, Benjamin and Petrik, Péter and Fried, Miklós and Nguyen Quoc, Khánh and Kamarás, Katalin and Székács, Inna and Horváth, Róbert and Kurunczi, Sándor (2020) Dextran-based Hydrogel Layers for Biosensors. In: Nanobiomaterial Engineering. Springer Singapore, Singapore, pp. 139-164. ISBN 9789813298408; 9789813298392

Chelu, M. and Stroescu, H. and Anastasescu, M. and Calderon-Moreno, J. M. and Preda, S. and Fogarassy, Zsolt and Petrik, Péter (2020) High-quality PMMA/ZnO NWs piezoelectric coating on rigid and flexible metallic substrates. APPLIED SURFACE SCIENCE, 529. ISSN 0169-4332

Nesheva, Diana and Fogarassy, Zsolt and Fábián, Margit and Hristova-Vasileva, Temenuga and Sulyok, Attila and Petrik, Péter (2020) Influence of fast neutron irradiation on the phase composition and optical properties of homogeneous SiOx and composite Si–SiOx thin films. JOURNAL OF MATERIALS SCIENCE. pp. 1-13. ISSN 0022-2461 (print); 1573-4803 (online)

Nagy, Richárd and Király, Márton and Petrik, Péter and Hózer, Zoltán (2020) Infrared observation of ballooning and burst of nuclear fuel cladding tubes. NUCLEAR ENGINEERING AND DESIGN, in pre. ISSN 0029-5493

Romanenko, Alekszej and Kalas, Benjamin and Hermann, Petra and Hakkel, Orsolya and Illés, Levente and Fried, Miklós and Fürjes, Péter and Gyulai, Gergő and Petrik, Péter (2020) Membrane-Based In Situ Mid-Infrared Spectroscopic Ellipsometry: A Study on the Membrane Affinity of Polylactide-co-glycolide Nanoparticulate Systems. ANALYTICAL CHEMISTRY, in pre. ISSN 0003-2700

Kalas, Benjamin and Zolnai, Zsolt and Sáfrán, György and Serényi, Miklós and Agócs, Emil and Lohner, Tivadar and Németh, Attila and Nguyen Quoc, Khánh and Fried, Miklós and Petrik, Péter (2020) Micro-combinatorial sampling of the optical properties of hydrogenated amorphous Si_{1-x}Ge_{x} for the entire range of compositions towards a database for optoelectronics. SCIENTIFIC REPORTS. ISSN 2045-2322

Petrik, Péter (2020) Optical Characterization of Oxide-Based Materials Using Ellipsometry. In: Oxide-Based Materials and Structures : Fundamentals and Applications. CRC Press, Boca Raton (FL), pp. 5-29. ISBN 9780429286728

Soleimani, Saeedeh and Kalas, Benjamin and Horváth, Zsolt Endre and Zolnai, Zsolt and Czigány, Zsolt and Németh, Attila and Petrik, Péter and Volk, János (2020) Optimization of co-sputtered CrxAl1−xN thin films for piezoelectric MEMS devices. JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS, 31. ISSN 0957-4522 (print); 1573-482X (online)

Lábadi, Zoltán and Kalas, Benjamin and Saftics, András and Illés, Levente and Jankovics, Hajnalka and Bereczk-Tompa, Éva and Kakasi, Balázs and Vonderviszt, Ferenc and Fried, Miklós and Petrik, Péter (2020) Sensing Layer for Ni Detection in Water Created by Immobilization of Bioengineered Flagellar Nanotubes on Gold Surfaces. ACS BIOMATERIALS-SCIENCE & ENGINEERING, 6 (7). pp. 3811-3820. ISSN 2373-9878

Khomenkova, L. and Makasheva, K. and Petrik, Péter and Tsybrii, Z. and Melnichuk, O. (2020) Spectroscopic characterization of phase transformation in Ge-rich Al2O3 films grown by magnetron co-sputtering. MATERIALS LETTERS, 277. ISSN 0167-577X

Nesheva, Diana and Petrik, Péter and Hristova-Vasileva, Temenuga and Fogarassy, Zsolt and Kalas, Benjamin (2019) Changes in composite nc-Si-SiO2 thin films caused by 20 MeV electron irradiation. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 458. pp. 159-163. ISSN 0168-583X

Petrik, Péter and Romanenko, Alekszej and Agócs, Emil and Kalas, Benjamin and Lohner, Tivadar and Perezné Feró, Erzsébet and Novotny, Tamás and Hózer, Zoltán (2019) Fűtőelemek cirkóniumburkolatának optikai felületvizsgálata. NUKLEON, 12 (7). pp. 32-35. ISSN 1789-9613

Kalas, Benjamin and Agócs, Emil and Romanenko, Alekszej and Petrik, Péter (2019) In Situ Characterization of Biomaterials at Solid-Liquid Interfaces Using Ellipsometry in the UV-Visible-NIR Wavelength Range. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2019. ISSN 1862-6300

Petrik, Péter and Romanenko, Alekszej and Kalas, Benjamin and Péter, László and Novotny, Tamás and Perez-Feró, Erzsébet and Fodor, Bálint and Agócs, Emil and Lohner, Tivadar and Kurunczi, Sándor and Hózer, Zoltán (2019) Optical Properties of Oxidized, Hydrogenated, and Native Zirconium Surfaces for Wavelengths from 0.3 to 25 µm − A Study by Ex Situ and In Situ Spectroscopic Ellipsometry. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2019. ISSN 1862-6300

Kolaklieva, Lilyana and Chitanov, Vasiliy and Szekeres, Anna and Antonova, Krassimira and Terziyska, Penka and Fogarassy, Zsolt and Petrik, Péter and Mihailescu, Ion N. and Duta, Liviu (2019) Pulsed Laser Deposition of Aluminum Nitride Films: Correlation between Mechanical, Optical, and Structural Properties. COATINGS, 9 (3). pp. 1-16. ISSN 2079-6412

Gurbán, Sándor and Petrik, Péter and Serényi, Miklós and Sulyok, Attila and Menyhárd, Miklós and Baradács, E. and Parditka, Bence and Cserháti, C. and Langer, G. A. and Erdélyi, Z. (2018) Electron irradiation induced amorphous SiO 2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces. SCIENTIFIC REPORTS, 8 (1). pp. 1-7. ISSN 2045-2322

Hristova-Vasileva, T. and Petrik, Péter and Nesheva, D. and Fogarassy, Zsolt and Lábár, János (2018) Influence of 20 MeV electron irradiation on the optical properties and phase composition of SiOx thin films. JOURNAL OF APPLIED PHYSICS, 123 (19). pp. 1-9. ISSN 0021-8979

Lohner, Tivadar and Kalas, Benjámin and Petrik, Péter and Zolnai, Zsolt and Serényi, Miklós and Sáfrán, György (2018) Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory. APPLIED SCIENCES, 8 (5). pp. 1-7. ISSN 2076-3417

Petrik, Péter (2018) Solar Cells with Photonic and Plasmonic Structures. In: Spectroscopic Ellipsometry for Photovoltaics 1. : Fundamental Principles and Solar Cell Characterization. Springer Series in Optical Sciences (212). Springer International Publishing, Cham, pp. 509-522. ISBN 978-3-319-75375-1

Petrik, Péter (2018) Solar cells with photonic and plasmonic structures. SPRINGER SERIES IN OPTICAL SCIENCES, 212. pp. 509-522. ISSN 0342-4111

Kalas, Benjamin and Pollakowski, Beatrix and Nutsch, Andreas and Streeck, Cornelia and Nádor, Judit and Fried, Miklós and Petrik, Péter (2017) Ellipsometric and X-Ray Spectrometric Investigation of Fibrinogen Protein Layers. PHYSICA STATUS SOLIDI C-CURRENT TOPICS IN SOLID STATE PHYSICS, 14 (12). pp. 1-7. ISSN 1862-6351

Agócs, Emil and Zolnai, Zsolt and Rossall, A. K. and Berg, J. A. van den and Fodor, Bálint and Kalas, Benjamin and Petrik, Péter (2017) Optical and structural characterization of Ge clusters embedded in ZrO2. APPLIED SURFACE SCIENCE, 421. pp. 283-288. ISSN 0169-4332

Petrik, Péter and Sulyok, Attila and Novotny, Tamás and Perez-Feró, Erzsébet and Kalas, Benjamin and Agócs, Emil and Lohner, Tivadar and Nagy, Richárd and Menyhárd, Miklós and Hózer, Zoltán (2017) Optical properties of Zr and ZrO2. APPLIED SURFACE SCIENCE, 404. pp. 1-4. ISSN 0169-4332

Kalas, Benjamin and Nádor, Judit and Agócs, Emil and Saftics, András and Kurunczi, S. and Fried, Miklós and Petrik, Péter (2017) Protein adsorption monitored by plasmon-enhanced semi-cylindrical Kretschmann ellipsometry. APPLIED SURFACE SCIENCE, 421. pp. 585-592. ISSN 0169-4332

Saftics, András and Kurunczi, Sándor and Türk, Barbara and Agócs, Emil and Kalas, Benjamin and Petrik, Péter and Fried, Miklós and Sulyok, Attila and Horváth, Róbert (2017) SPIN COATED CARBOXYMETHY L DEXTRAN LAYERS ON TiO 2 -SiO 2 OPTICAL WAVEGUIDE SURFACES. REVUE ROUMAINE DE CHIMIE, 62 (10). pp. 775-782. ISSN 0035-3930

Fogarassy, Zsolt and Petrik, Péter and Duta, L. and Mihailescu, I. N. and Anastasescu, M. and Gartner, M. and Antonova, K. and Szekeres, A. (2017) TEM and AFM studies of aluminium nitride films synthesized by pulsed laser deposition. APPLIED PHYSICS A - MATERIALS SCIENCE AND PROCESSING, 123 (12). p. 756. ISSN 0947-8396

Bányász, István and Pelli, S. and Nunzi-Conti, G. and Righini, G. C. and Berneschi, S. and Szilágyi, Edit and Fried, Miklós and Lohner, Tivadar and Petrik, Péter and Zolnai, Zsolt and Nguyen Quoc, Khánh and Veres, Miklós and Himics, László (2016) Design and fabrication of integrated optical elements in glasses and crystals by various ion beam techniques. In: 12th International Topical Meeting on Nuclear Applications of Accelerators (AccApp '15). American Nuclear Society, Kensington, pp. 389-415.

Fodor, Bálint and Kozma, Péter and Burger, S. and Fried, Miklós and Petrik, Péter (2016) Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method. Thin Solid Films. pp. 1-5. ISSN 0040-6090

Agócs, Emil and Kozma, Péter and Nádor, Judit and Hámori, András and Janosov, Milán and Kurunczi, Sándor and Fodor, Bálint and Fried, Miklós and Horváth, Róbert and Petrik, Péter (2016) Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions. Applied Surface Science. pp. 1-6. ISSN 0169-4332 (In Press)

Fodor, Bálint and Agócs, Emil and Bardet, Benjamin and Defforge, Thomas and Cayrel, Frederic and Fried, Miklós and Petrik, Péter (2016) Porosity and thickness characterization of porous Si and oxidized porous Si layers – an ultraviolet-visible-mid infrared ellipsometry study. MICROPOROUS and Mesoporous Materials, in pre. in press. ISSN 1387-1811

Lohner, Tivadar and Serényi, Miklós and Petrik, Péter (2016) Spectroellipsometric Characterization of Sputtered Silicon Nitride Films Using Two Different Dispersion Relations. INTERNATIONAL JOURNAL OF NEW HORIZONS IN PHYSICS, 3 (1). pp. 7-10. ISSN 2314-4564

Lohner, Tivadar and Serényi, Miklós and Szilágyi, Edit and Zolnai, Zsolt and Czigány, Zsolt and Nguyen Quoc, Khánh and Petrik, Péter and Fried, Miklós (2016) Spectroellipsometric detection of silicon substrate damage caused by radiofrequency sputtering of niobium oxide. APPLIED SURFACE SCIENCE. pp. 1-30. ISSN 0169-4332

Fodor, Bálint and Defforge, Thomas and Agócs, Emil and Fried, Miklós and Gautier, Gaël and Petrik, Péter (2016) Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires. APPLIED SURFACE SCIENCE. pp. 1-8. ISSN 0169-4332

Jose, Gin and Chandrappan, Jayakrishnan and Suraya, Ahmad Kamil and Murray, Matthew and Zolnai, Zsolt and Agócs, Emil and Petrik, Péter (2016) Ultrafast laser plasma assisted rare-earth doping for silicon photonics. CONFERENCE ON LASERS AND ELECTRO-OPTICS, 2016. ISSN 2160-9020

Lohner, Tivadar and Serényi, Miklós and Petrik, Péter (2015) Characterization of sputtered aluminum oxide films using spectroscopic ellipsometry. INTERNATIONAL JOURNAL OF NEW HORIZONS IN PHYSICS, 2 (1). pp. 1-4. ISSN 2314-4564

Chandrappan, Jayakrishnan and Murray, Matthew and Petrik, Péter and Agócs, Emil and Zolnai, Zsolt (2015) Doping silica beyond limits with laser plasma for active photonic materials. OPTICAL MATERIALS EXPRESS, 5 (12). pp. 2849-2861. ISSN 2159-3930

Fried, Miklós and Major, Csaba and Juhász, György and Petrik, Péter and Horváth, Zoltán György (2015) Expanded beam speetro-ellipsometry for big area on-line monitoring. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9525. pp. 1-12. ISSN 0277-786X

Petrik, Péter and Kumar, N. and Fried, Miklós and Fodor, Bálint and Juhász, György (2015) Fourier ellipsometry - An ellipsometric approach to Fourier scatterometry. JOURNAL OF THE EUROPEAN OPTICAL SOCIETY-RAPID PUBLICATIONS, 10. p. 15002. ISSN 1990-2573

Petrik, Péter and Fodor, Bálint and Agócs, Emil and Kozma, Péter and Nádor, Judit and Juhász, György and Major, Csaba (2015) Methods for optical modeling and cross-checking in ellipsometry and scatterometry. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9526. pp. 1-11. ISSN 0277-786X (Unpublished)

Petrik, Péter and Agócs, Emil and Kalas, B. and Kozma, Péter and Fodor, Bálint and Nádor, Judit and Major, Csaba and Fried, Miklós (2015) Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9529. pp. 1-5. ISSN 0277-786X

Kozma, Péter and Janosov, Milán and Petrik, Péter (2015) Optikai bioérzékelés. MAGYAR TUDOMÁNY, 2015 (10). pp. 1171-1179. ISSN 0025-0325

Bin Anooz, S. and Petrik, Péter and Schmidbauer, M. and Remmele, T. and Schwarzkopf, J. (2015) Refractive index and interband transitions in strain modified NaNbO<inf>3</inf> thin films grown by MOCVD. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 48 (38). p. 385303. ISSN 0022-3727

Chandrappan, J. and Murray, M. and Kakkar, T. and Petrik, Péter and Agócs, Emil and Zolnai, Zsolt (2015) Target dependent femtosecond laser plasma implantation dynamics in enabling silica for high density erbium doping. SCIENTIFIC REPORTS, 5. pp. 1-8. ISSN 2045-2322

Agócs, Emil and Fodor, Bálint and Pollakowski, B. and Beckhoff, B. and Nutscha, A. and Petrik, Péter (2014) Approaches to calculate the dielectric function of ZnO around the band gap. THIN SOLID FILMS, 571. pp. 684-688. ISSN 0040-6090

Fodor, Bálint and Cayrel, F. and Agócs, Emil and Alquier, D. and Fried, Miklós and Petrik, Péter (2014) Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride. THIN SOLID FILMS, 571. pp. 567-572. ISSN 0040-6090

Dortu, Fabian and Bernier, Damien and Cestier, Isabelle and Vandormael, Denis and Emmerechts, Carl and Fodor, Bálint and Agócs, Emil and Petrik, Péter and Fried, Miklós (2014) Composite polymeric-inorganic waveguide fabricated by injection molding for biosensing applications. In: 16th International Conference on Transparent Optical Networks, ICTON 2014. International Conference on Transparent Optical Networks-ICTON . IEEE Computer Society, New York, pp. 1-4. ISBN 9781479956005

Nádor, Judit and Orgován, Norbert and Fried, Miklós and Petrik, Péter and Sulyok, Attila and Horváth, Róbert (2014) Enhanced protein adsorption and cellular adhesion using transparent titanate nanotube thin films made by a simple and inexpensive room temperature process: Application to optical biochips. COLLOIDS AND SURFACES B-BIOINTERFACES, 122. pp. 491-497. ISSN 0927-7765

Lohner, Tivadar and Jagadeesh Kumar, K. and Petrik, Péter and Subrahmanyam, Aryasomayajula and Bársony, István (2014) Optical analysis of room temperature magnetron sputtered ITO films by reflectometry and spectroscopic ellipsometry. Journal of Materials Research, 29 (14). pp. 1528-1536. ISSN 0884-2914 (print), 2044-5326 (online)

Ramanandan, G. K. P. and Adam, A. J. L. and Ramakrishnan, G. and Petrik, Péter and Hendrikx, R. (2014) Optical characterization of gold-cuprous oxide interfaces for terahertz emission applications. APPLIED OPTICS (2004-), 53 (10). pp. 1994-2000. ISSN 1559-128X

Petrik, Péter and Kumar, N. and Agócs, Emil and Fodor, Bálint and Pereira, S. F. and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of laterally and vertically structured oxides and semiconductors. In: 5th Annual Oxide Based Materials and Devices Conference. Proceedings of SPIE - The International Society for Optical Engineering (8987). SPIE, San Francisco, 89870E. ISBN 9780819499004

Petrik, Péter and Kumar, N and Juhász, György and Major, Csaba and Fodor, Bálint and Agócs, Emil and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of macro-, micro- and nanostructures using polarized light. JOURNAL OF PHYSICS-CONFERENCE SERIES, 558 (1). 012008. ISSN 1742-6588

Rosu, D. and Petrik, Péter and Rattmann, G. and Schellenberger, M. and Beck, U. (2014) Optical characterization of patterned thin films. THIN SOLID FILMS, 571 (P3). pp. 601-604. ISSN 0040-6090

Landwehr, J. and Fader, R. and Rumler, M. and Rommel, M. and Bauer, AJ. and Petrik, Péter (2014) Optical polymers with tunable refractive index for nanoimprint technologies. NANOTECHNOLOGY, 25 (50). p. 505301. ISSN 0957-4484

Petrik, Péter (2014) Parameterization of the dielectric function of semiconductor nanocrystals. PHYSICA B - CONDENSED MATTER, 453. pp. 2-7. ISSN 0921-4526

Kumar, N. and Petrik, Péter and Ramanandan, G. K. P. and El Gawhary, O. and Roy, S. (2014) Reconstruction of sub-wavelength features and nano-positioning of gratings using coherent Fourier scatterometry. OPTICS EXPRESS, 22 (20). pp. 24678-24688. ISSN 1094-4087

Petrik, Péter and Agócs, Emil and Volk, János and Lukács, István Endre and Fodor, Bálint and Kozma, Péter and Lohner, Tivadar and Fried, Miklós (2014) Resolving lateral and vertical structures by ellipsometry using wavelength range scan. THIN SOLID FILMS, 571 (3). pp. 579-583. ISSN 0040-6090

Kőrösi, László Tamás and Scarpellini, Alice and Petrik, Péter and Papp, Szilvia and Dékány, Imre (2014) Sol-gel synthesis of nano structured indium tin oxide with controlled morphology and porosity. APPLIED SURFACE SCIENCE, 320. pp. 725-731. ISSN 0169-4332

Lohner, Tivadar and Agócs, Emil and Petrik, Péter and Zolnai, Zsolt and Szilágyi, Edit and Kovács, Imre and Szőkefalvi-Nagy, Zoltán and Tóth, Lajos and Tóth, Attila Lajos and Bársony, István (2014) Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration. THIN SOLID FILMS, 571 (3). pp. 715-719. ISSN 0040-6090

Petrik, Péter and Pollakowski, B. and Zakel, S. and Lábadi, Zoltán and Baji, Zsófia (2013) Characterization of ZnO structures by optical and X-ray methods. Applied Surface Science, 281. pp. 123-128. ISSN 0169-4332

Gumprechte, T. and Petrik, Péter and Roeder, G. and Schellenberger, M. and Pfitzner, L. and Pollakowski, B. and Beckhoff, B. (2013) Characterization of thin ZnO films by vacuum ultra-violet reflectometry. MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, 1494. pp. 65-70. ISSN 0272-9172

Petrik, Péter and Gumprechte, T. and Nutscha, A. and Juhász, György and Polgár, Olivér and Major, Csaba and Kozma, Péter and Agócs, Emil and Fried, Miklós (2013) Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry. Thin Solid Films, 541. pp. 131-135. ISSN 0040-6090

Holfelder, Ina and Beckhoff, Burkhard and Fliegauf, Rolf and Hönicke, Philipp and Nutsch, Andreas and Petrik, Péter and Roederd, Georg and Weser, Jan (2013) Complementary methodologies for thin film characterization in one tool - a novel instrument for 450 mm wafers. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 28 (4). pp. 549-557. ISSN 0267-9477

Szekeres, A. and Alexandrova, S. and Petrik, Péter (2013) Ellipsometric study of crystalline silicon hydrogenated by plasma immersion ion implantation. Applied Surface Science, 281. pp. 105-108. ISSN 0169-4332

Petrik, Péter and Fried, Miklós (2013) Ellipsometry of semiconductor nanocrystals. In: Ellipsometry at the nanoscale. Springer-Verlag, Berlin Heidelberg, pp. 583-606. ISBN 978-3-642-33956-1

Petrik, Péter and Agócs, Emil (2013) High sensitivity optical characterization of thin films with embedded Si nanocrystals. ECS TRANSACTIONS, 53 (4). pp. 43-52. ISSN 1938-5862

Shan, Ambalanath and Fried, Miklós and Juhász, György and Major, Csaba and Polgár, Olivér and Németh, Ágoston and Petrik, Péter (2013) High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin Film Photovoltaics. IEEE JOURNAL OF PHOTOVOLTAICS, 4 (1). pp. 355-361. ISSN 2156-3381

Saftics, András and Agócs, Emil and Fodor, Bálint and Patkó, Dániel and Petrik, Péter and Fürjes, Péter and Horváth, Róbert and Kurunczi, Sándor (2013) Investigation of thin polymer layers for biosensor applications. APPLIED SURFACE SCIENCE, 281. pp. 66-72. ISSN 0169-4332

Agócs, Emil and Nassiopoulou, Androula G. and Milita, Silvia and Petrik, Péter (2013) Model dielectric function analysis of the critical point features of silicon nanocrystal films in a broad parameter range. THIN SOLID FILMS, 541. pp. 83-86. ISSN 0040-6090

Tamáska, István and Vértesy, Zofia and Deák, András and Petrik, Péter and Kertész, Krisztián Imre and Biró, László Péter (2013) Optical properties of bioinspired disordered photonic nanoarchitectures. NANOPAGES, 8 (2). pp. 17-30. ISSN 1787-4033

Pramatarova, Lilyana D. and Hikov, Todor A. and Krasteva, Natalia A. and Petrik, Péter and Agócs, Emil (2013) Protein adsorption on detonation nanodiamond/polymer composite layers. MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, 1479. pp. 51-56. ISSN 0272-9172

Lohner, Tivadar and Csíkvári, P. and Petrik, Péter and Hárs, György (2013) Spectroellipsometric characterization of nanocrystalline diamond layers. Applied Surface Science, 281. pp. 113-117. ISSN 0169-4332

Petrik, Péter and Kurunczi, Sándor and Nguyen, Quoc Khanh and Polgár, Olivér (2010) Nanoszemcsés szerkezetek és vékonyrétegek ellipszometriai modellezése bioszenzorikai és (opto)elektronikai alkalmazásokhoz = Ellipsometric modelling of nanograin structures and thin films for biological and (opto)electronical applications. Project Report. OTKA.

Serényi, Miklós and Lohner, Tivadar and Petrik, Péter and Zolnai, Zsolt and Horváth, Zsolt Endre and Nguyen Quoc, Khánh (2008) Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction. THIN SOLID FILMS, 516 (22). pp. 8096-8100. ISSN 0040-6090

Lohner, Tivadar and Serényi, Miklós and Basa, D.K. and Nguyen Quoc, Khánh and Nemcsics, Ákos and Petrik, Péter and Turmezei, Péter (2008) Composition and Thickness of RE Sputtered Amorphous Silicon Alloy Films. ACTA POLYTECHNICA HUNGARICA, 5 (2). pp. 23-30. ISSN 1785-8860

Fried, Miklós and Lohner, Tivadar and Nguyen, Quoc Khanh and Petrik, Péter (2008) Optikai modellek fejlesztése sokösszetevős anyagrendszerek ellipszometriai vizsgálatához = Optical model development for ellipsometric study of many-compound materials. Project Report. OTKA.

Serényi, Miklós and Lohner, Tivadar and Petrik, Péter and Frigeri, C. (2007) Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy. Thin Solid Films, 515 (7-8). pp. 3559-3562. ISSN 0040-6090

Gyulai, József and Arató, Péter and Balázsi, Csaba and Battistig, Gábor and Biró, László Péter and Hárs, György and Lábadi, Zoltán and Lohner, Tivadar and Makkai, Zsolt and Menyhárd, Miklós and Nguyen, Quoc Khanh and Pászti, Ferenc and Petrik, Péter and Ster, András and Tóth, Lajos and Vargáné dr. Josepovits, Katalin (2007) Ionsugaras módszerek a fizikai nanotechnológiában (IONNANO) = Ion beam modifications in near-to-physics nanotechnology. Project Report. OTKA.

Horváth, Zsolt József and Basa, Péter and Petrik, Péter and Dücső, Csaba and Jászi, T. and Dobos, László and Tóth, Lajos and Lohner, Tivadar and Pécz, Béla and Fried, Miklós (2005) Si nanocrystals in sandwiched SiNx structures. In: Semiconductor nanocrystals. MTA MFA, Budapest, pp. 417-420. ISBN 963-7371-18-4

Petrik, Péter (1999) Characterization of polysilicon thin films using in situ and ex situ spectroscopic ellipsometry. PhD thesis, Budapesti Műszaki Egyetem ; MTA MFA.

This list was generated on Fri Mar 29 08:38:57 2024 CET.