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Items where Author is "Petrik, Péter"

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Article

Fodor, Bálint and Kozma, Péter and Burger, S. and Fried, Miklós and Petrik, Péter (2016) Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method. Thin Solid Films. pp. 1-5. ISSN 0040-6090

Fodor, Bálint and Agócs, Emil and Bardet, Benjamin and Defforge, Thomas and Cayrel, Frederic and Fried, Miklós and Petrik, Péter (2016) Porosity and thickness characterization of porous Si and oxidized porous Si layers – an ultraviolet-visible-mid infrared ellipsometry study. MICROPOROUS and Mesoporous Materials, in pre. in press. ISSN 1387-1811

Lohner, Tivadar and Serényi, Miklós and Petrik, Péter (2016) Spectroellipsometric Characterization of Sputtered Silicon Nitride Films Using Two Different Dispersion Relations. INTERNATIONAL JOURNAL OF NEW HORIZONS IN PHYSICS, 3 (1). pp. 7-10. ISSN 2314-4564

Lohner, Tivadar and Serényi, Miklós and Petrik, Péter (2015) Characterization of sputtered aluminum oxide films using spectroscopic ellipsometry. INTERNATIONAL JOURNAL OF NEW HORIZONS IN PHYSICS, 2 (1). pp. 1-4. ISSN 2314-4564

Chandrappan, Jayakrishnan and Murray, Matthew and Petrik, Péter and Agócs, Emil and Zolnai, Zsolt (2015) Doping silica beyond limits with laser plasma for active photonic materials. OPTICAL MATERIALS EXPRESS, 5 (12). pp. 2849-2861. ISSN 2159-3930

Fried, Miklós and Major, Csaba and Juhász, György and Petrik, Péter and Horváth, Zoltán György (2015) Expanded beam speetro-ellipsometry for big area on-line monitoring. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9525. pp. 1-12. ISSN 0277-786X

Petrik, Péter and Kumar, N. and Fried, Miklós and Fodor, Bálint and Juhász, György (2015) Fourier ellipsometry - An ellipsometric approach to Fourier scatterometry. JOURNAL OF THE EUROPEAN OPTICAL SOCIETY-RAPID PUBLICATIONS, 10. p. 15002. ISSN 1990-2573

Petrik, Péter and Fodor, Bálint and Agócs, Emil and Kozma, Péter and Nádor, Judit and Juhász, György and Major, Csaba (2015) Methods for optical modeling and cross-checking in ellipsometry and scatterometry. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9526. pp. 1-11. ISSN 0277-786X (Unpublished)

Petrik, Péter and Agócs, Emil and Kalas, B. and Kozma, Péter and Fodor, Bálint and Nádor, Judit and Major, Csaba and Fried, Miklós (2015) Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 9529. pp. 1-5. ISSN 0277-786X

Kozma, Péter and Janosov, Milán and Petrik, Péter (2015) Optikai bioérzékelés. MAGYAR TUDOMÁNY, 2015 (10). pp. 1171-1179. ISSN 0025-0325

Bin Anooz, S. and Petrik, Péter and Schmidbauer, M. and Remmele, T. and Schwarzkopf, J. (2015) Refractive index and interband transitions in strain modified NaNbO<inf>3</inf> thin films grown by MOCVD. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 48 (38). p. 385303. ISSN 0022-3727

Chandrappan, J. and Murray, M. and Kakkar, T. and Petrik, Péter and Agócs, Emil and Zolnai, Zsolt (2015) Target dependent femtosecond laser plasma implantation dynamics in enabling silica for high density erbium doping. SCIENTIFIC REPORTS, 5. pp. 1-8. ISSN 2045-2322

Agócs, Emil and Fodor, Bálint and Pollakowski, B. and Beckhoff, B. and Nutscha, A. and Petrik, Péter (2014) Approaches to calculate the dielectric function of ZnO around the band gap. THIN SOLID FILMS, 571. pp. 684-688. ISSN 0040-6090

Fodor, Bálint and Cayrel, F. and Agócs, Emil and Alquier, D. and Fried, Miklós and Petrik, Péter (2014) Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride. THIN SOLID FILMS, 571. pp. 567-572. ISSN 0040-6090

Nádor, Judit and Orgován, Norbert and Fried, Miklós and Petrik, Péter and Sulyok, Attila and Horváth, Róbert (2014) Enhanced protein adsorption and cellular adhesion using transparent titanate nanotube thin films made by a simple and inexpensive room temperature process: Application to optical biochips. COLLOIDS AND SURFACES B-BIOINTERFACES, 122. pp. 491-497. ISSN 0927-7765

Lohner, Tivadar and Jagadeesh Kumar, K. and Petrik, Péter and Subrahmanyam, Aryasomayajula and Bársony, István (2014) Optical analysis of room temperature magnetron sputtered ITO films by reflectometry and spectroscopic ellipsometry. Journal of Materials Research, 29 (14). pp. 1528-1536. ISSN 0884-2914 (print), 2044-5326 (online)

Ramanandan, G. K. P. and Adam, A. J. L. and Ramakrishnan, G. and Petrik, Péter and Hendrikx, R. (2014) Optical characterization of gold-cuprous oxide interfaces for terahertz emission applications. APPLIED OPTICS (2004-), 53 (10). pp. 1994-2000. ISSN 1559-128X

Petrik, Péter and Kumar, N and Juhász, György and Major, Csaba and Fodor, Bálint and Agócs, Emil and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of macro-, micro- and nanostructures using polarized light. JOURNAL OF PHYSICS-CONFERENCE SERIES, 558 (1). 012008. ISSN 1742-6588

Rosu, D. and Petrik, Péter and Rattmann, G. and Schellenberger, M. and Beck, U. (2014) Optical characterization of patterned thin films. THIN SOLID FILMS, 571 (P3). pp. 601-604. ISSN 0040-6090

Landwehr, J. and Fader, R. and Rumler, M. and Rommel, M. and Bauer, AJ. and Petrik, Péter (2014) Optical polymers with tunable refractive index for nanoimprint technologies. NANOTECHNOLOGY, 25 (50). p. 505301. ISSN 0957-4484

Petrik, Péter (2014) Parameterization of the dielectric function of semiconductor nanocrystals. PHYSICA B - CONDENSED MATTER, 453. pp. 2-7. ISSN 0921-4526

Kumar, N. and Petrik, Péter and Ramanandan, G. K. P. and El Gawhary, O. and Roy, S. (2014) Reconstruction of sub-wavelength features and nano-positioning of gratings using coherent Fourier scatterometry. OPTICS EXPRESS, 22 (20). pp. 24678-24688. ISSN 1094-4087

Petrik, Péter and Agócs, Emil and Volk, János and Lukács, István Endre and Fodor, Bálint and Kozma, Péter and Lohner, Tivadar and Fried, Miklós (2014) Resolving lateral and vertical structures by ellipsometry using wavelength range scan. THIN SOLID FILMS, 571 (3). pp. 579-583. ISSN 0040-6090

Kőrösi, László Tamás and Scarpellini, Alice and Petrik, Péter and Papp, Szilvia and Dékány, Imre (2014) Sol-gel synthesis of nano structured indium tin oxide with controlled morphology and porosity. APPLIED SURFACE SCIENCE, 320. pp. 725-731. ISSN 0169-4332

Lohner, Tivadar and Agócs, Emil and Petrik, Péter and Zolnai, Zsolt and Szilágyi, Edit and Kovács, Imre and Szőkefalvi-Nagy, Zoltán and Tóth, Lajos and Tóth, Attila Lajos and Bársony, István (2014) Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration. THIN SOLID FILMS, 571 (3). pp. 715-719. ISSN 0040-6090

Petrik, Péter and Pollakowski, B. and Zakel, S. and Lábadi, Zoltán and Baji, Zsófia (2013) Characterization of ZnO structures by optical and X-ray methods. Applied Surface Science, 281. pp. 123-128. ISSN 0169-4332

Gumprechte, T. and Petrik, Péter and Roeder, G. and Schellenberger, M. and Pfitzner, L. and Pollakowski, B. and Beckhoff, B. (2013) Characterization of thin ZnO films by vacuum ultra-violet reflectometry. MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, 1494. pp. 65-70. ISSN 0272-9172

Petrik, Péter and Gumprechte, T. and Nutscha, A. and Juhász, György and Polgár, Olivér and Major, Csaba and Kozma, Péter and Agócs, Emil and Fried, Miklós (2013) Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry. Thin Solid Films, 541. pp. 131-135. ISSN 0040-6090

Holfelder, Ina and Beckhoff, Burkhard and Fliegauf, Rolf and Hönicke, Philipp and Nutsch, Andreas and Petrik, Péter and Roederd, Georg and Weser, Jan (2013) Complementary methodologies for thin film characterization in one tool - a novel instrument for 450 mm wafers. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 28 (4). pp. 549-557. ISSN 0267-9477

Szekeres, A. and Alexandrova, S. and Petrik, Péter (2013) Ellipsometric study of crystalline silicon hydrogenated by plasma immersion ion implantation. Applied Surface Science, 281. pp. 105-108. ISSN 0169-4332

Petrik, Péter and Agócs, Emil (2013) High sensitivity optical characterization of thin films with embedded Si nanocrystals. ECS TRANSACTIONS, 53 (4). pp. 43-52. ISSN 1938-5862

Shan, Ambalanath and Fried, Miklós and Juhász, György and Major, Csaba and Polgár, Olivér and Németh, Ágoston and Petrik, Péter (2013) High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin Film Photovoltaics. IEEE JOURNAL OF PHOTOVOLTAICS, 4 (1). pp. 355-361. ISSN 2156-3381

Saftics, András and Agócs, Emil and Fodor, Bálint and Patkó, Dániel and Petrik, Péter and Fürjes, Péter and Horváth, Róbert and Kurunczi, Sándor (2013) Investigation of thin polymer layers for biosensor applications. APPLIED SURFACE SCIENCE, 281. pp. 66-72. ISSN 0169-4332

Agócs, Emil and Nassiopoulou, Androula G. and Milita, Silvia and Petrik, Péter (2013) Model dielectric function analysis of the critical point features of silicon nanocrystal films in a broad parameter range. THIN SOLID FILMS, 541. pp. 83-86. ISSN 0040-6090

Tamáska, István and Vértesy, Zofia and Deák, András and Petrik, Péter and Kertész, Krisztián Imre and Biró, László Péter (2013) Optical properties of bioinspired disordered photonic nanoarchitectures. NANOPAGES, 8 (2). pp. 17-30. ISSN 1787-4033

Pramatarova, Lilyana D. and Hikov, Todor A. and Krasteva, Natalia A. and Petrik, Péter and Agócs, Emil (2013) Protein adsorption on detonation nanodiamond/polymer composite layers. MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, 1479. pp. 51-56. ISSN 0272-9172

Lohner, Tivadar and Csíkvári, P. and Petrik, Péter and Hárs, György (2013) Spectroellipsometric characterization of nanocrystalline diamond layers. Applied Surface Science, 281. pp. 113-117. ISSN 0169-4332

Serényi, Miklós and Lohner, Tivadar and Petrik, Péter and Zolnai, Zsolt and Horváth, Zsolt Endre and Nguyen Quoc, Khánh (2008) Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction. THIN SOLID FILMS, 516 (22). pp. 8096-8100. ISSN 0040-6090

Lohner, Tivadar and Serényi, Miklós and Basa, D.K. and Nguyen Quoc, Khánh and Nemcsics, Ákos and Petrik, Péter and Turmezei, Péter (2008) Composition and Thickness of RE Sputtered Amorphous Silicon Alloy Films. ACTA POLYTECHNICA HUNGARICA, 5 (2). pp. 23-30. ISSN 1785-8860

Serényi, Miklós and Lohner, Tivadar and Petrik, Péter and Frigeri, C. (2007) Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy. Thin Solid Films, 515 (7-8). pp. 3559-3562. ISSN 0040-6090

Book Section

Petrik, Péter and Kumar, N. and Agócs, Emil and Fodor, Bálint and Pereira, S. F. and Lohner, Tivadar and Fried, Miklós (2014) Optical characterization of laterally and vertically structured oxides and semiconductors. In: 5th Annual Oxide Based Materials and Devices Conference. Proceedings of SPIE - The International Society for Optical Engineering (8987). SPIE, San Francisco, 89870E. ISBN 9780819499004

Petrik, Péter and Fried, Miklós (2013) Ellipsometry of semiconductor nanocrystals. In: Ellipsometry at the nanoscale. Springer-Verlag, Berlin Heidelberg, pp. 583-606. ISBN 978-3-642-33956-1

Horváth, Zsolt József and Basa, Péter and Petrik, Péter and Dücső, Csaba and Jászi, T. and Dobos, László and Tóth, Lajos and Lohner, Tivadar and Pécz, Béla and Fried, Miklós (2005) Si nanocrystals in sandwiched SiNx structures. In: Semiconductor nanocrystals. MTA MFA, Budapest, pp. 417-420. ISBN 963-7371-18-4

Monograph

Petrik, Péter and Kurunczi, Sándor and Nguyen, Quoc Khanh and Polgár, Olivér (2010) Nanoszemcsés szerkezetek és vékonyrétegek ellipszometriai modellezése bioszenzorikai és (opto)elektronikai alkalmazásokhoz = Ellipsometric modelling of nanograin structures and thin films for biological and (opto)electronical applications. Project Report. OTKA.

Fried, Miklós and Lohner, Tivadar and Nguyen, Quoc Khanh and Petrik, Péter (2008) Optikai modellek fejlesztése sokösszetevős anyagrendszerek ellipszometriai vizsgálatához = Optical model development for ellipsometric study of many-compound materials. Project Report. OTKA.

Gyulai, József and Arató, Péter and Balázsi, Csaba and Battistig, Gábor and Biró, László Péter and Hárs, György and Lábadi, Zoltán and Lohner, Tivadar and Makkai, Zsolt and Menyhárd, Miklós and Nguyen, Quoc Khanh and Pászti, Ferenc and Petrik, Péter and Ster, András and Tóth, Lajos and Vargáné dr. Josepovits, Katalin (2007) Ionsugaras módszerek a fizikai nanotechnológiában (IONNANO) = Ion beam modifications in near-to-physics nanotechnology. Project Report. OTKA.

Thesis

Petrik, Péter (1999) Characterization of polysilicon thin films using in situ and ex situ spectroscopic ellipsometry. PhD thesis, Budapesti Műszaki Egyetem ; MTA MFA.

This list was generated on Sat Jul 30 09:20:09 2016 CEST.