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Items where Author is "Petrik, Péter"

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Article

Lohner, Tivadar and Agócs, Emil and Petrik, Péter and Zolnai, Zsolt and Szilágyi, Edit and Kovács, Imre and Szőkefalvi-Nagy, Zoltán and Tóth, Lajos and Tóth, Attila Lajos and Bársony, István (2014) Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration. THIN SOLID FILMS, 550. ISSN 0040-6090 (In Press)

Petrik, Péter and Pollakowski, B. and Zakel, S. and Lábadi, Zoltán and Baji, Zsófia (2013) Characterization of ZnO structures by optical and X-ray methods. Applied Surface Science, 281. pp. 123-128. ISSN 0169-4332

Gumprechte, T. and Petrik, Péter and Roeder, G. and Schellenberger, M. and Pfitzner, L. and Pollakowski, B. and Beckhoff, B. (2013) Characterization of thin ZnO films by vacuum ultra-violet reflectometry. MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, 1494. pp. 65-70. ISSN 0272-9172

Petrik, Péter and Gumprechte, T. and Nutscha, A. and Juhász, György and Polgár, Olivér and Major, Csaba and Kozma, Péter and Agócs, Emil and Fried, Miklós (2013) Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry. Thin Solid Films, 541. pp. 131-135. ISSN 0040-6090

Holfelder, Ina and Beckhoff, Burkhard and Fliegauf, Rolf and Hönicke, Philipp and Nutsch, Andreas and Petrik, Péter and Roederd, Georg and Weser, Jan (2013) Complementary methodologies for thin film characterization in one tool - a novel instrument for 450 mm wafers. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 28 (4). pp. 549-557. ISSN 0267-9477

Szekeres, A. and Alexandrova, S. and Petrik, Péter (2013) Ellipsometric study of crystalline silicon hydrogenated by plasma immersion ion implantation. Applied Surface Science, 281. pp. 105-108. ISSN 0169-4332

Petrik, Péter and Agócs, Emil (2013) High sensitivity optical characterization of thin films with embedded Si nanocrystals. ECS TRANSACTIONS, 53 (4). pp. 43-52. ISSN 1938-5862

Shan, Ambalanath and Fried, Miklós and Juhász, György and Major, Csaba and Polgár, Olivér and Németh, Ágoston and Petrik, Péter (2013) High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin Film Photovoltaics. IEEE JOURNAL OF PHOTOVOLTAICS. ISSN 2156-3381 (In Press)

Saftics, András and Agócs, Emil and Fodor, Bálint and Patkó, Dániel and Petrik, Péter and Fürjes, Péter and Horváth, Róbert and Kurunczi, Sándor (2013) Investigation of thin polymer layers for biosensor applications. APPLIED SURFACE SCIENCE, 281. pp. 66-72. ISSN 0169-4332

Agócs, Emil and Nassiopoulou, Androula G. and Milita, Silvia and Petrik, Péter (2013) Model dielectric function analysis of the critical point features of silicon nanocrystal films in a broad parameter range. THIN SOLID FILMS, 541. pp. 83-86. ISSN 0040-6090

Tamáska, István and Vértesy, Zofia and Deák, András and Petrik, Péter and Kertész, Krisztián Imre and Biró, László Péter (2013) Optical properties of bioinspired disordered photonic nanoarchitectures. NANOPAGES, 8 (2). pp. 17-30. ISSN 1787-4033

Pramatarova, Lilyana D. and Hikov, Todor A. and Krasteva, Natalia A. and Petrik, Péter and Agócs, Emil (2013) Protein adsorption on detonation nanodiamond/polymer composite layers. MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, 1479. pp. 51-56. ISSN 0272-9172

Lohner, Tivadar and Csíkvári, P. and Petrik, Péter and Hárs, György (2013) Spectroellipsometric characterization of nanocrystalline diamond layers. Applied Surface Science, 281. pp. 113-117. ISSN 0169-4332

Serényi, Miklós and Lohner, Tivadar and Petrik, Péter and Zolnai, Zsolt and Horváth, Zsolt Endre and Nguyen Quoc, Khánh (2008) Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction. THIN SOLID FILMS, 516 (22). pp. 8096-8100. ISSN 0040-6090

Lohner, Tivadar and Serényi, Miklós and Basa, D.K. and Nguyen Quoc, Khánh and Nemcsics, Ákos and Petrik, Péter and Turmezei, Péter (2008) Composition and Thickness of RE Sputtered Amorphous Silicon Alloy Films. ACTA POLYTECHNICA HUNGARICA, 5 (2). pp. 23-30. ISSN 1785-8860

Serényi, Miklós and Lohner, Tivadar and Petrik, Péter and Frigeri, C. (2007) Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy. Thin Solid Films, 515 (7-8). pp. 3559-3562. ISSN 0040-6090

Book Section

Petrik, Péter and Fried, Miklós (2013) Ellipsometry of semiconductor nanocrystals. In: Ellipsometry at the nanoscale. Springer-Verlag, Berlin Heidelberg, pp. 583-606. ISBN 978-3-642-33956-1

Monograph

Petrik, Péter and Kurunczi, Sándor and Nguyen, Quoc Khanh and Polgár, Olivér (2010) Nanoszemcsés szerkezetek és vékonyrétegek ellipszometriai modellezése bioszenzorikai és (opto)elektronikai alkalmazásokhoz = Ellipsometric modelling of nanograin structures and thin films for biological and (opto)electronical applications. Project Report. OTKA.

Gyulai, József and Arató, Péter and Balázsi, Csaba and Battistig, Gábor and Biró, László Péter and Hárs, György and Lábadi, Zoltán and Lohner, Tivadar and Makkai, Zsolt and Menyhárd, Miklós and Nguyen, Quoc Khanh and Pászti, Ferenc and Petrik, Péter and Ster, András and Tóth, Lajos and Vargáné dr. Josepovits, Katalin (2007) Ionsugaras módszerek a fizikai nanotechnológiában (IONNANO) = Ion beam modifications in near-to-physics nanotechnology. Project Report. OTKA.

Thesis

Petrik, Péter (1999) Characterization of polysilicon thin films using in situ and ex situ spectroscopic ellipsometry. PhD thesis, Budapesti Műszaki Egyetem ; MTA MFA.

This list was generated on Sun Apr 20 05:36:21 2014 CEST.